Range-Adaptive Wireless Power Transfer Using Multiloop and Tunable Matching Techniques von Kim, Jungsik, Jeong, Jinho

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The Impact of Displacement Defect in Nanosheet Field Effect Transistor von Kim, Jungsik

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Reduction of Variability in Junctionless and Inversion-Mode FinFETs by Stringer Gate Structure von Jungsik Kim, Jin-Woo Han, Meyyappan, M.

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Insights into radiation displacement defect in an insulated-gate bipolar transistor von Kim, Kihyun, Kim, Jungsik

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Improvement of Tribological Properties and Corrosion Resistance of AISI 4340M Steel by Shot Peening and Plating Technologies von Ahn, Seok-Hwan, Kim, Jungsik, Amanov, Auezhan

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Novel Program Scheme of Vertical NAND Flash Memory for Reduction of Z-Interference von Yi, Su-in, Kim, Jungsik

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Statistical variability study of random dopant fluctuation on gate-all-around inversion-mode silicon nanowire field-effect transistors von Yoon, Jun-Sik, Rim, Taiuk, Kim, Jungsik, Kim, Kihyun, Baek, Chang-Ki, Jeong, Yoon-Ha

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Caution: Abnormal Variability Due to Terrestrial Cosmic Rays in Scaled-Down FinFETs von Kim, Jungsik, Lee, Jeong-Soo, Han, Jin-Woo, Meyyappan, M.

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Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects von Bang, Minji, Ha, Jonghyeon, Lee, Gyeongyeop, Suh, Minki, Kim, Jungsik

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Submillimeter-Wave Waveguide-to-Microstrip Transitions for Wide Circuits/Wafers von Kim, Jungsik, Choe, Wonseok, Jeong, Jinho

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Overhang Saddle Fin Sidewall Structure for Highly Reliable DRAM Operation von Han, Jin-Woo, Suh, Minki, Lee, Gyeongyeop, Kim, Jungsik

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H-Band Power Amplifier Integrated Circuits Using 250-nm InP HBT Technology von Jungsik Kim, Sanggeun Jeon, Moonil Kim, Urteaga, Miguel, Jinho Jeong

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Vertical gate-all-around junctionless nanowire transistors with asymmetric diameters and underlap lengths von Yoon, Jun-Sik, Rim, Taiuk, Kim, Jungsik, Meyyappan, Meyya, Baek, Chang-Ki, Jeong, Yoon-Ha

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Influence of Radiation-Induced Displacement Defect in 1.2 kV SiC Metal-Oxide-Semiconductor Field-Effect Transistors von Lee, Gyeongyeop, Ha, Jonghyeon, Kim, Kihyun, Bae, Hagyoul, Kim, Chong-Eun, Kim, Jungsik

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Effect of Noncircular Channel on Distribution of Threshold Voltage in 3D NAND Flash Memory von Go, Donghyun, Yoon, Gilsang, Park, Jounghun, Kim, Donghwi, Kim, Jiwon, Kim, Jungsik, Lee, Jeong-Soo

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Mitigation of Single Event Upset Effects in Nanosheet FET 6T SRAM Cell von Bang, Minji, Ha, Jonghyeon, Suh, Minki, Lee, Dabok, Ryu, Minsang, Han, Jin-Woo, Sagong, Hyunchul, Lee, Hojoon, Kim, Jungsik

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Comprehensive Hammering and Parasitic BJT Effects in Vertically Stacked DRAM von Suh, Minki, Ryu, Minsang, Ha, Jonghyeon, Bang, Minji, Lee, Dabok, Lee, Hojoon, Sagong, Hyunchul, Kim, Jungsik

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Effect of Quasi-One-Dimensional Properties on Source/Drain Contacts in Vertical Nanowire Field-Effect Transistors (VNWFETs) von Park, Iksoo, Choi, Jaeyong, Kim, Jungsik, Kong, Byoung Don, Lee, Jeong-Soo

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Investigation on the Emission Characteristics with a Wet-Type Exhaust Gas Cleaning System for Marine Diesel Engine Application von Ryu, Younghyun, Kim, Taewoo, Kim, Jungsik, Nam, Jeonggil

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LOOP SWITCHING TECHNIQUE FOR WIRELESS POWER TRANSFER USING MAGNETIC RESONANCE COUPLING von Kim, Jungsik, Choi, Won-Seok, Jeong, Jinho

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