Structure determination and structure refinement of Al2CuMg precipitates by quantitative high-resolution electron microscopy von KILAAS, Roar, RADMILOVIC, Velimir

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Structure determination and structure refinement of Al 2CuMg precipitates by quantitative high-resolution electron microscopy von Kilaas, Roar, Radmilovic, Velimir

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Application of Aberration-Corrected TEM and Image Simulation to Nanoelectronics and Nanotechnology von Korgel, B.A., Lee, D.C., Hanrath, T., Yacaman, M.J., Thesen, A., Matijevic, M., Kilaas, R., Kisielowski, C., Diebold, A.C.

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On the inclusion of upper Laue layers in computational methods in high resolution transmission electron microscopy von Kilaas, Roar, O'Keefe, Michael A., Krishnan, Kannan M.

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Contrast effects at grooved interfaces von Rasmussen, D.René, Simpson, Yonn Kouh, Kilaas, Roar, Carter, C.Barry

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Effects of Fresnel Fringes on TEM Images of Interfaces in X-Ray Multilayers von Nguyen, Tai D, O'Keefe, Michael A, Kilaas, Roar, Gronsky, Ronald, Kortright, Jeffrey B

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