Layer resolved structural relaxation at the surface of magnetic FePt icosahedral nanoparticles von Wang, R M, Dmitrieva, O, Farle, M, Dumpich, G, Ye, H Q, Poppa, H, Kilaas, R, Kisielowski, C

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Optimal and near‐optimal filters in high‐resolution electron microscopy von Kilaas, R.

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Quantitative measurement of displacement and strain fields from HREM micrographs von Hÿtch, M.J., Snoeck, E., Kilaas, R.

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3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography von Jinschek, J.R., Batenburg, K.J., Calderon, H.A., Kilaas, R., Radmilovic, V., Kisielowski, C.

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Surface Reconstruction with a Fractional Hole: (sqrt[5] x sqrt[5])R26.6 degrees LaAlO3 (001) von Lanier, C H, Rondinelli, J M, Deng, B, Kilaas, R, Poeppelmeier, K R, Marks, L D

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Nickel accumulation and nickel oxalate precipitation by Aspergillus niger von Magyarosy, A, Laidlaw, R.D, Kilaas, R, Echer, C, Clark, D.S, Keasling, J.D

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Structure and morphology of S-phase precipitates in aluminum von Radmilovic, V., Kilaas, R., Dahmen, U., Shiflet, G.J.

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Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution von Kisielowski, C., Hetherington, C.J.D., Wang, Y.C., Kilaas, R., O’Keefe, M.A., Thust, A.

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Nonlinear imaging using annular dark field TEM von Bals, S., Kilaas, R., Kisielowski, C.

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EDM 1.0: Electron direct methods von Kilaas, R., Marks, L.D., Own, C.S.

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Determination of the atomic structure of a Σ13 SrTiO3 grain boundary von Ayache, J., Kisielowski, C., Kilaas, R., Passerieux, G., Lartigue-Korinek, S.

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Application of Aberration-Corrected TEM and Image Simulation to Nanoelectronics and Nanotechnology von Korgel, B.A., Lee, D.C., Hanrath, T., Yacaman, M.J., Thesen, A., Matijevic, M., Kilaas, R., Kisielowski, C., Diebold, A.C.

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Quantitative analysis of strain field in thin films from HRTEM micrographs von Snoeck, E, Warot, B, Ardhuin, H, Rocher, A, Casanove, M.J, Kilaas, R, Hÿtch, M.J

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A pattern recognition technique for the analysis of grain boundary structure by HREM von Paciornik, S., Kilaas, R., Turner, J., Dahmen, U.

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Structure determination and structure refinement of Al2CuMg precipitates by quantitative high-resolution electron microscopy von KILAAS, Roar, RADMILOVIC, Velimir

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On the improved phase-grating method von Kilaas, R.

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Surface Reconstruction with a Fractional Hole: ({radical}(5)x{radical}(5))R26.6 deg. LaAlO{sub 3} (001) von Lanier, C. H., Rondinelli, J. M., Deng, B., Kilaas, R., Marks, L. D., Poeppelmeier, K. R.

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Surface Reconstruction with a Fractional Hole: ( 5 × 5 ) R 26.6 ° LaAlO 3 (001) von Lanier, C. H., Rondinelli, J. M., Deng, B., Kilaas, R., Poeppelmeier, K. R., Marks, L. D.

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Assessment of specimen noise in HREM images of simple structures von Paciornik, S., Kilaas, R., Dahmen, U.

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Study of the Structure of Ferroelectric Domain Walls in Barium Titanate Ceramics von Thorel, A., Kilaas, R., Normand, L., Montardi, Y.

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