Environmental gas impact on the emission volume of X-rays near the interface in the variable pressure scanning electron microscopy von Mansour, O., Lateb, N., Zoukel, A., Hafsi, Z., Kadoun, A., Khouchaf, L.

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Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy von Hafsi, Z., Mansour, O., Kadoun, A., Khouchaf, L., Mathieu, C.

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The secondary X-ray fluorescence and absorption near the interface of multi-material: Case of EDS microanalysis von Zoukel, A., Khouchaf, L.

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Evidence of depolymerisation of amorphous silica at medium- and short-range order: XANES, NMR and CP-SEM contributions von Khouchaf, L., Hamoudi, A., Cordier, P.

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Study of structural short order and surface changes of SiO2 compounds von Oufakir A., Khouchaf L., Elaatmani M., Zegzouti A., Louarn G., Ben Fraj A.

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Monte Carlo simulation of the electron beam scattering under water vapor environment at low energy von Mansour, O., Kadoun, A., Khouchaf, L., Mathieu, C.

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Study of the thermal treatment of SiO2 aggregate von Tahiri, N, Khouchaf, L, Elaatmani, M, Louarn, G, Zegzouti, A, Daoud, M

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Skirting effects in the variable pressure scanning electron microscope: Limitations and improvements von Zoukel, A., Khouchaf, L., Martino, J.Di, Ruch, D.

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Study of structural short order and surface changes of SiO2 compounds von Oufakir, A, Khouchaf, L, Elaatmani, M, Zegzouti, A, Louarn, G, A Ben Fraj

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Multi-technique and multi-scale approach applied to study the structural behavior of heterogeneous materials : natural SiO2 case von KHOUCHAF, L, VERSTRAETE, J

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Microstructural evolution of amorphous silica following alkali–silica reaction von Hamoudi, A., Khouchaf, L., Depecker, C., Revel, B., Montagne, L., Cordier, P.

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A new approach to reach the best resolution of X-ray microanalysis in the variable pressure SEM von Zoukel, A., Khouchaf, L., Arnoult, C., Di Martino, J., Ruch, D.

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Microanalysis results with low Z gas inside environmental SEM von Khouchaf, L., Mathieu, C., Kadoun, Abd-Ed-Daïm

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Study of the Microstructure of Amorphous Silica Nanostructures Using High-Resolution Electron Microscopy, Electron Energy Loss Spectroscopy, X-ray Powder Diffraction, and Electron... von Khouchaf, Lahcen, Boulahya, Khalid, Das, Partha Pratim, Nicolopoulos, Stavros, Kis, Viktória Kovács, Lábár, János L.

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Structural investigation of thin films of Ti1-xAlxN ternary nitrides using Ti K-edge X-ray absorption fine structure von TUILIER, M.-H, PAC, M.-J, COVAREL, G, ROUSSELOT, C, KHOUCHAF, L

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Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy von Hafsi, Z., Mansour, O., Kadoun, A., Khouchaf, L., Mathieu, C.

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Monte Carlo Study of the Interaction Volume Changes by the Beam Skirt in VP-SEM von El Azzouzi, M., Khouchaf, L., Achahbar, A.

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Environmental Scanning Electron Microscope study of SiO2 heterogeneous material with helium and water vapor von Khouchaf, L., Boinski, F.

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Amorphisation mechanism of a flint aggregate during the alkali–silica reaction: X-ray diffraction and X-ray absorption XANES contributions von Verstraete, J., Khouchaf, L., Bulteel, D., Garcia-Diaz, E., Flank, A.M, Tuilier, M.H.

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Nouvelle approche pour le suivi de la réactivité de phases SiO 2 soumises à la Réaction Alcali Silice (RAS) von Jabkhiro, E., Hamoudi, A., Khouchaf, L., Boinski, F., Harfouche, M.

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