C60 + Secondary Ion Microscopy Using a Delay Line Detector von Klerk, Leendert A, Lockyer, Nicholas P, Kharchenko, Andriy, MacAleese, Luke, Dankers, Patricia Y. W, Vickerman, John C, Heeren, Ron M. A

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Simulations of nw measurement using multiple detection electrodes in FTICR mass spectrometry von Driver, Joshua A., Kharchenko, Andriy, Amster, I. Jonathan

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Optimization of plasma parameters for the production of silicon nano-crystals von Chaâbane, Nihed, Kharchenko, Andriy V, Vach, Holger, Roca i Cabarrocas, Pere

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Complex of Suggestions on Improving the Psychological Correction and Diagnostics of Traumatic Emotional Experience Among Military Servants with Post-Stress Psychological Dysaptatio... von Andriy О. Kharchenko

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Structural Features for Cognitive Representations of Traumatic Emotional Experience Among Demobilized Combatants in Ukraine with Post-Stress Psychological Disadaptation von Andriy О. Kharchenko

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Multiparticle Simulations of Quadrupolar Ion Detection in an Ion Cyclotron Resonance Cell with Four Narrow Aperture Detection Electrodes von Driver, Joshua A., Nagornov, Konstantin O., Kozhinov, Anton N., Tsybin, Yury O., Kharchenko, Andriy, Amster, I. Jonathan

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Performance of Orbitrap Mass Analyzer at Various Space Charge and Non-Ideal Field Conditions: Simulation Approach von Kharchenko, Andriy, Vladimirov, Gleb, Heeren, Ron M. A., Nikolaev, Eugene N.

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Fast image–charge calculations for multi-particle simulations in FT-ICR analyzer cells of arbitrary geometry von Driver, Joshua A., Kharchenko, Andriy, Heeren, Ron M.A., Amster, I. Jonathan

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Advanced Mass Calibration and Visualization for FT-ICR Mass Spectrometry Imaging von Smith, Donald F., Kharchenko, Andriy, Konijnenburg, Marco, Klinkert, Ivo, Paša-Tolić, Ljiljana, Heeren, Ron M. A.

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DEVICE FOR MEASURING A SECONDARY VACUUM PRESSURE, AND ON-BOARD SYSTEM FOR MEASURING A RESIDUAL VACUUM PRESSURE von KHARCHENKO, Andriy

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Analysis of phase dependent frequency shifts in simulated FTMS transients using the filter diagonalization method von Leach, Franklin E., Kharchenko, Andriy, Vladimirov, Gleb, Aizikov, Konstantin, O’Connor, Peter B., Nikolaev, Eugene, Heeren, Ron M.A., Amster, I. Jonathan

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C 60 + Secondary Ion Microscopy Using a Delay Line Detector von Klerk, Leendert A., Lockyer, Nicholas P., Kharchenko, Andriy, MacAleese, Luke, Dankers, Patricia Y. W., Vickerman, John C., Heeren, Ron M. A.

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Comparison of Particle-In-Cell Simulations with Experimentally Observed Frequency Shifts Between Ions of the Same Mass-To-Charge in Fourier Transform Ion Cyclotron Resonance Mass S... von Leach, Franklin E., Kharchenko, Andriy, Heeren, Ron M.A., Nikolaev, Eugene, Amster, I. Jonathan

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Système et procédé pour le revêtement d'un substrat verrier von KHARCHENKO, Andriy

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SYSTEM AND METHOD FOR COATING A GLASS SUBSTRATE von KHARCHENKO, Andriy

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Dispositivo para medir la presión de vacío secundaria y sistema integrado para medir la presión de vacío residual von KHARCHENKO, Andriy

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Dispositif de mesure de pression vide secondaire et système embarqué pour mesure de pression de vide résiduel von KHARCHENKO, ANDRIY

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DEVICE FOR MEASURING A SECONDARY VACUUM PRESSURE, AND ON-BOARD SYSTEM FOR MEASURING A RESIDUAL VACUUM PRESSURE von KHARCHENKO Andriy

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GLAZING INCLUDING A STACK OF THIN LAYERS von CAILLET, XAVIER, KHARCHENKO, ANDRIY

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C^sub 60^+ Secondary Ion Microscopy Using a Delay Line Detector von Klerk, Leendert A, Lockyer, Nicholas P, Kharchenko, Andriy, MacAleese, Luke, Dankers, Patricia Y W, Vickerman, John C, Heeren, Ron M A

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