Enedis approach for the roll-out of technical smart grid industrial solutions von Karsenti, Laurent, Daguzan, Philippe

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Cost-benefit analysis of MV reactive power management and active power curtailment von De Alvaro Garcia, Leticia, Beaune, François, Pitard, Mathilde, Karsenti, Laurent

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Using LV distributed generation's reactive power for voltage regulation von Wautier, Louis, Beaune, François, Fournel, Josselin, Karsenti, Laurent

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Adaptive tracking strategy for a class of nonlinear systems von Hotzel, R., Karsenti, L.

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Detecting defects on a wafer with run time use of design data von KARSENTI LAURENT, DUFFY BRIAN

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Adaptive control of nonlinear systems with nonlinear parameterization von Karsenti, Laurent, Lamnabhi-Lagarrigue, Françoise, Bastin, Georges

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Context-based defect inspection von RIES Bradley, SHMUEL Oriel Ben, KARSENTI Laurent, VIRK Kuljit S, GARBIN Emanuel, GORSKI Yakir, DUFFY Brian, FENSTER Shlomi, ELRON Asaf, BERDICHEVSKY Ruslan, DEKEL Ron, DOVRAT Oren, SMEKHOV Sasha

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Detecting Defects on a Wafer with Run Time Use of Design Data von KARSENTI LAURENT, DUFFY BRIAN

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Accelerated training of a machine learning based model for semiconductor applications von Mahadevan, Mohan, He, Li, Venkataraman, Sankar, Karsenti, Laurent, Nien, Hung, Zhang, Jing, Duffy, Brian, Ying, Huajun, Young, Scott, Bhaskar, Kris

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Method for defect detection and process monitoring based on SEM images von KARSENTI LAURENT

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Method for defect detection and process monitoring based on SEM images von Karsenti, Laurent

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CONTEXT-BASED DEFECT INSPECTION von VIRK, Kuljit S, FENSTER, Shlomi, SHMUEL, Oriel Ben, GARBIN, Emanuel, DEKEL, Ron, ELRON, Asaf, DUFFY, Brian, BERDICHEVSKY, Ruslan, RIES, Bradley, SMEKHOV, Sasha, KARSENTI, Laurent, GORSKI, Yakir, DOVRAT, Oren

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TRAINING A NEURAL NETWORK FOR DEFECT DETECTION IN LOW RESOLUTION IMAGES von HIEBERT, Stephen, RIES, Bradley, KARSENTI, Laurent, YEOH, Richard (Seng Wee), NICOLAIDES, Lena, BHASKAR, Kris

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Virtual inspection systems for process window characterization von Ramachandran, Vijayakumar, Karsenti, Laurent, Wagner, Mark, Duffy, Brian, Bhaskar, Kris

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Context-based defect inspection von Virk, Kuljit S, Karsenti, Laurent, Berdichevsky, Ruslan, Ries, Bradley, Duffy, Brian, Dovrat, Oren, Garbin, Emanuel, Smekhov, Sasha, Fenster, Shlomi, Gorski, Yakir, Dekel, Ron, Elron, Asaf J, Shmuel, Oriel Ben

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TRAINING A NEURAL NETWORK FOR DEFECT DETECTION IN LOW RESOLUTION IMAGES von HIEBERT, Stephen, RIES, Bradley, KARSENTI, Laurent, YEOH, Richard (Seng Wee), NICOLAIDES, Lena, BHASKAR, Kris

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CONTEXT-BASED DEFECT INSPECTION von Virk, Kuljit S, Karsenti, Laurent, Berdichevsky, Ruslan, Ries, Bradley, Duffy, Brian, Dovrat, Oren, Garbin, Emanuel, Smekhov, Sasha, Fenster, Shlomi, Gorski, Yakir, Dekel, Ron, Elron, Asaf J, Shmuel, Oriel Ben

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Training a neural network for defect detection in low resolution images von Ries, Brad, Yeoh, Richard (Seng Wee), Karsenti, Laurent, Nicolaides, Lena, Bhaskar, Kris, Hiebert, Stephen

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Detecting defects on a wafer with run time use of design data von KARSENTI, LAURENT, DUFFY, BRIAN

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Systems and methods for region-adaptive defect detection von Ramachandran, Vijayakumar, Brauer, Bjorn, Karsenti, Laurent, Maher, Christopher, Rosengaus, Eliezer, Miller, Roni, Jordan, III, John R

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