Approximating the nearest stable discrete-time system von Gillis, Nicolas, Karow, Michael, Sharma, Punit

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μ-VALUES AND SPECTRAL VALUE SETS FOR LINEAR PERTURBATION CLASSES DEFINED BY A SCALAR PRODUCT von KAROW, Michael

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A note on approximating the nearest stable discrete-time descriptor systems with fixed rank von Gillis, Nicolas, Karow, Michael, Sharma, Punit

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Convexity of the joint numerical range: topological and differential geometric viewpoints von Gutkin, Eugene, Jonckheere, Edmond A., Karow, Michael

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On a Perturbation Bound for Invariant Subspaces of Matrices von Karow, Michael, Kressner, Daniel

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Updating structured matrix pencils with no spillover effect on unmeasured spectral data and deflating pair von Adhikari, Bibhas, Datta, Biswa Nath, Ganai, Tinku, Karow, Michael

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Matrix polynomials with specified eigenvalues von Karow, Michael, Mengi, Emre

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Approximation of pseudospectra of block triangular matrices von Roy, Nandita, Karow, Michael, Bora, Shreemayee, Armentia, Gorka

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STRUCTURED PSEUDOSPECTRA AND THE CONDITION OF A NONDEROGATORY EIGENVALUE von KAROW, Michael

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[mu]-Values and Spectral Value Sets for Linear Perturbation Classes Defined by a Scalar Product von Karow, Michael

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On the structured distance to uncontrollability von Karow, Michael, Kressner, Daniel

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Eigenvalue condition numbers and a formula of Burke, Lewis and Overton von Karow, Michael

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STRUCTURED PSEUDOSPECTRA FOR SMALL PERTURBATIONS von KAROWT, Michael

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On the computation of structured singular values and pseudospectra von Karow, Michael, Kokiopoulou, Effrosyni, Kressner, Daniel

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Structured Eigenvalue Backward Errors of Matrix Pencils and Polynomials with Palindromic Structures von Bora, Shreemayee, Karow, Michael, Mehl, Christian, Sharma, Punit

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Nonlinear Eigenvalue Problems with Specified Eigenvalues von Karow, Michael, Kressner, Daniel, Mengi, Emre

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Structured Eigenvalue Backward Errors of Matrix Pencils and Polynomials with Hermitian and Related Structures von Bora, Shreemayee, Karow, Michael, Mehl, Christian, Sharma, Punit

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Contoured device sample preparation technique for ±5μm remaining silicon thicknesses that meets solid immersion lens requirements von Richardson, Chris, Liechty, Gary, Smith, Clay, Karow, Michael

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Eigenvalue condition numbers and a formula of Burke, Lewis and Overton von Karow, Michael

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Contoured device sample preparation technique for plus or minus 5 mu m remaining silicon thicknesses that meets solid immersion lens requirements von Richardson, Chris, Liechty, Gary, Smith, Clay, Karow, Michael

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