Selected Success Stories from Twenty Years of High-k Gate Dielectric Research von Kar, Samares

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Properties of electronic traps at silicon/1-octadecene interfaces von Kar, Samares, Miramond, Corinne, Vuillaume, Dominique

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On the Characteristics of Traps and Charges in the Si/SiO2/HfO2/TaN High-k Gate Stacks von Kar, Samares

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On the Characteristics of Traps and Charges in the Si/SiO 2 /HfO 2 /TaN High-k Gate Stacks von Kar, Samares

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Closed-Form Model for High-k MOSFET Channel Parameters: Reflecting Non-Saturating Inversion Surface Potential, Gate Stack Traps, and Work Function Anomaly von Kar, Samares

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Study of silicon–organic interfaces by admittance spectroscopy von Kar, Samares

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Parameter extraction using novel phenomena in nano-MOSFETs with ultra-thin (EOT = 0.46–1.93 nm) high-K gate dielectrics von Kar, Samares

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A Drain Current - Drain Voltage Relation for MOSFETs with High-k Gate Stacks von Kar, S.

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Extraction of the capacitance of ultrathin high-K gate dielectrics von Kar, S.

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Determination of the gate dielectric capacitance of ultrathin high-k layers von KAR, Samares

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Extraction of Trap Parameters for High-Κ Gate Stacks von Kar, Samares, Rawat, S.

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Modelling of Layers and Traps in High-Κ Gate Stacks and Energy Band and Equivalent Circuit Representations von Kar, Samares, Rawat, S.

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Selected Success Stories from Twenty Years of High-k Gate Dielectric Research von Kar, Samares

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Characterization of accumulation layer capacitance for extracting data on high-κ gate dielectrics von KAR, Samares, RAWAT, Surendra, RAKHEJA, Shaloo, REDDY, Dharmendar

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Low trap density nonleaky SiGe quantum well MOS structures: Fabrication and characteristics von KAR, Samares, ZAUMSEIL, Peter

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Modelling of Dielectrics and Traps in High-Κ Gate Dielectric Stacks and Equivalent Circuit Representation von Kar, Samares, Rawat, S.

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Extraction of Trap Parameters for High-Κ Gate Dielectric Stacks von Rawat, S., Kar, Samares

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METAL-DEPENDENT INTERFACE STATES IN THIN MOS STRUCTURES von Kar, Samares, Dahlke, Walter E.

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Ion-dosage-dependent room-temperature hysteresis in MOS structures with thin oxides von Raychaudhuri, A., Chatterjee, S., Ashok, S., Kar, S.

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On the mechanism of carrier transport in metal-thin-oxide semiconductor diodes on Polycrystalline silicon von Kar, S., Panchal, K.M., Bhattacharya, S., Varma, S.

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