New scan compression approach to reduce the test data volume von Shantagiri, Pralhadrao V., Kapur, Rohit, Shastry, Chandrasekar

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Aggressive Exclusion of Scan Flip-Flops from Compression Architecture for Better Coverage and Reduced TDV: A Hybrid Approach von Shantagiri, Pralhadrao V., Kapur, Rohit

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A Scan Obfuscation Guided Design-for-Security Approach for Sequential Circuits von Karmakar, Rajit, Chattopadhyay, Santanu, Kapur, Rohit

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Scan Chain Masking for Diagnosis of Multiple Chain Failures in a Space Compaction Environment von Kundu, Subhadip, Chattopadhyay, Santanu, Sengupta, Indranil, Kapur, Rohit

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Handling Unknown with Blend of Scan and Scan Compression von Shantagiri, Pralhadrao V., Kapur, Rohit

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Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization von Kundu, Subhadip, Jha, Aniket, Chattopadhyay, Santanu, Sengupta, Indranil, Kapur, Rohit

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VLSI Test Principles and Architectures von Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Nur A. Touba, Erik H. Volkerink, Duncan Walker, Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Shianling Wu

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A Metric for Test Set Characterization and Customization Toward Fault Diagnosis von Kundu, Subhadip, Pal, Sankhadeep, Chattopadhyay, Santanu, Sengupta, Indranil, Kapur, Rohit

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Experience of indian army’s aeromedical evacuation of casualities von Sasidharan, Shibu, Montagnon, Sophie, Kapur, Rohit, Singh Dhillon, Harpreet

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VLSI Test Principles and Architectures - Design for Testability von Wang, Laung-Terng, Wu, Cheng-Wen, Wen, Xiaoqing

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An ATE assisted DFD technique for volume diagnosis of scan chains von Kundu, Subhadip, Chattopadhyay, Santanu, Sengupta, Indranil, Kapur, Rohit

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Bounded Adjacent Fill for Low Capture Power Scan Testing von Chandra, A., Kapur, R.

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Scalable Adaptive Scan (SAS) von Chandra, A., Kapur, R., Kanzawa, Y.

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Breaking the Test Application Time Barriers in Compression: Adaptive Scan-Cyclical (AS-C) von Chandra, A., Saikia, J., Kapur, R.

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Multiple Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization von Kundu, S, Chattopadhyay, S, Sengupta, I, Kapur, R

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Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction von Chandra, A., Ng, F., Kapur, R.

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On IEEE P1500's Standard for Embedded Core Test von Marinissen, Erik Jan, Kapur, Rohit, Lousberg, Maurice, Mclaurin, Teresa, Ricchetti, Mike, Zorian, Yervant

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Predictive solutions for test - The next DFT paradigm? von Allsup, C., Kapur, R.

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A Diagnosability Metric for Test Set Selection Targeting Better Fault Detection von Kundu, S., Chattopadhyay, S., Sengupta, I., Kapur, R.

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Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction von Chandra, A., Haihua Yan, Kapur, R.

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