Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface von Kauffmann, Y., Oh, S.H., Koch, C.T., Hashibon, A., Scheu, C., Rühle, M., Kaplan, W.D.

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experimental method for calibration of the plasmon mean free path von MELTZMAN, H, KAUFFMANN, Y, THANGADURAI, P, DROZDOV, M, BARAM, M, BRANDON, D, KAPLAN, W.D

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Preface to the Special Section E-MRS MACAN von Chatain, Dominique, Kaplan, Wayne D., Finnis, Mike, Scheu, Chrisitina

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Nanometer-Thick Equilibrium Films: The Interface Between Thermodynamics and Atomistics von Baram, Mor, Chatain, Dominique, Kaplan, Wayne D.

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Ordered Liquid Aluminum at the Interface with Sapphire von Oh, S. H, Kauffmann, Y, Scheu, C, Kaplan, W. D, Růhle, M

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The mechanism of initial de-wetting and detachment of thin Au films on YSZ von Shaffir, E., Riess, I., Kaplan, W.D.

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Quantitative HRTEM analysis of FIB prepared specimens von BARAM, M, KAPLAN, W.D

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Orientation relationships of copper crystals on c-plane sapphire von Curiotto, Stefano, Chien, Harry, Meltzman, Hila, Wynblatt, Paul, Rohrer, Gregory S., Kaplan, Wayne D., Chatain, Dominique

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A review of wetting vs. adsorption, complexions and related phenomena: the Rosetta stone of wetting von Kaplan, W.D., Chatain, D., Wynblatt, P., Carter, W.C.

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Orientation relationship of Cu crystals on the sapphire (10-10) m-plane and (10-12) r-plane von Chatain, D., Curiotto, S., Wynblatt, P., Meltzman, H., Kaplan, W.D., Rohrer, G.S.

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Aluminium-alumina interface morphology and thermodynamics from dewetting experiments von Levi, G., Kaplan, W.D.

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Copper crystals on the (110) sapphire plane: orientation relationships, triple line ridges and interface shape equilibrium von Curiotto, Stefano, Chien, Harry, Meltzman, Hila, Labat, Stephane, Wynblatt, Paul, Rohrer, Gregory S., Kaplan, Wayne D., Chatain, Dominique

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The equilibrium shape of nickel von Meltzman, Hila, Chatain, D., Avizemer, Dan, Besmann, T.M., Kaplan, W.D.

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Laser cladding of turbine blades von Shepeleva, L., Medres, B., Kaplan, W.D., Bamberger, M., Weisheit, A.

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The influence of electron-beam irradiation on electrical characteristics of metal–insulator–semiconductor capacitors based on a high- k dielectric stack of HfTiSiO(N) and HfTiO(N)... von Thangadurai, P., Kaplan, W.D., Mikhelashvili, V., Eisenstein, G.

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The correlation of the electrical properties with electron irradiation and constant voltage stress for MIS devices based on high- k double layer (HfTiSiO:N and HfTiO:N) dielectrics von Mikhelashvili, V., Thangadurai, P., Kaplan, W.D., Eisenstein, G.

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Nucleation and growth of CVD Al on different types of TiN von Avinun, M, Barel, N, Kaplan, W.D, Eizenberg, M, Naik, M, Guo, T, Chen, L.Y, Mosely, R, Littau, K, Zhou, S, Chen, L

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Microstructure and chemical analysis of Hf-based high-k dielectric layers in metal–insulator–metal capacitors von Thangadurai, P., Mikhelashvili, V., Eisenstein, G., Kaplan, W.D.

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The effect of light irradiation on electrons and holes trapping in nonvolotile memory capacitors employing sub 10nm SiO2–HfO2 stacks and Au nanocrystals von Mikhelashvili, V., Meyler, B., Garbrecht, M., Cohen-Hyams, T., Roizin, Y., Lisiansky, M., Kaplan, W.D., Salzman, Y., Eisenstein, G.

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The effect of light irradiation on electrons and holes trapping in nonvolotile memory capacitors employing sub 10 nm SiO 2–HfO 2 stacks and Au nanocrystals von Mikhelashvili, V., Meyler, B., Garbrecht, M., Cohen-Hyams, T., Roizin, Y., Lisiansky, M., Kaplan, W.D., Salzman, Y., Eisenstein, G.

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