Smart Phased Array SoCs: A Novel Application for Advanced SiGe HBT BiCMOS Technology von Kane, B.C., Geis, L.A., Wyatt, M.A., Copeland, D.G., Mogensen, J.A.

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Test structures for evaluating strong phase shift lithography von Ashton, R.A., Kane, B.C., Blatchford, J.W., Shuttleworth, D.M.

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Smart phased array SoCs : A novel application for advanced SiGe HBT BiCMOS technology: Special issue on silicon germanium - advanced technology, modeling, and design von KANE, Brittin C, GEIS, Larry A, WYATT, Michael A, COPELAND, David G, MOGENSEN, Jeffrey A

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High gain monolithic W-band low noise amplifiers based on pseudomorphic high electron mobility transistors von Der-Wei Tu, Duncan, S.W., Eskandarian, A., Golja, B., Kane, B.C., Svensson, S.P., Weinreb, S., Byer, N.E.

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Method of determining accuracy error in line width metrology device von Kane, Brittin C, McIntosh, John M

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Method of determining accuracy error in line width metrology device von MCINTOSH JOHN M, KANE BRITTIN C

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Efficiency enhancement for MMIC amplifiers von Griffith, Jonathan Paul, Kane, Brittin C, Trippe, Michael W

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Efficiency enhancement for MMIC amplifiers von GRIFFITH JONATHAN PAUL, KANE BRITTIN C, TRIPPE MICHAEL W

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Method of analyzing semiconductor surface with patterned feature using line width metrology von MCINTOSH JOHN M, KANE BRITTIN C

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Efficiency enhancement for MMIC amplifiers von GRIFFITH JONATHAN PAUL, KANE BRITTIN C, TRIPPE MICHAEL W

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Method of sectioning of photoresist for shape evaluation von MCINTOSH JOHN M, MOLLOY SIMON J, VARTULI CATHERINE, KANE BRITTIN C, HOUGE ERIK C

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Method analyzing a semiconductor surface using line width metrology with auto-correlation operation von JESSEN SCOTT, MCINTOSH JOHN M, MOLLOY SIMON J, BLATCHFORD JAMES W, KANE BRITTIN C, LAYADI NACE

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Location of defects using dye penetration von KANE, BRITTIN C, HENRY, TODD C, CREVASSE, ANNETTE M, MCINTOSH, JOHN M

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