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  1. 1
    INTEGRATED CIRCUIT DEVICE, SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD OF THEIR DEVICES

    INTEGRATED CIRCUIT DEVICE, SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD OF THEIR DEVICES von LEE CHANG-HWAN, KAN SOSHU

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  2. 2
    INTEGRATED CIRCUIT FOR PERFORMING BURN-IN TEST OF AC STRESS AND TESTING METHOD USING THE SAME

    INTEGRATED CIRCUIT FOR PERFORMING BURN-IN TEST OF AC STRESS AND TESTING METHOD USING THE SAME von SIN YUN-SEUNG, KIN TOO, KWAK CHOONG-KEUN, KAN SOSHU

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  3. 3
    DATA OUTPUT CIRCUIT FOR SEMICONDUCTOR DEVICE

    DATA OUTPUT CIRCUIT FOR SEMICONDUCTOR DEVICE von JO EIGO, KAKU CHUKON, KAN SOSHU

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