Identification of a novel COCH mutation, I109N, highlights the similar clinical features observed in DFNA9 families von Kamarinos, Maria, McGill, Jim, Lynch, Michael, Dahl, Henrik

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Prevalence and nature of connexin 26 mutations in children with non‐syndromic deafness von Dahl, Hans‐Henrik M, Saunders, Kerryn, Kelly, Therese M, Osborn, Amelia H, Wilcox, Stephen, Cone‐Wesson, Barbara, Wunderlich, Julia L, Du Sart, Desiree, Kamarinos, Maria, Gardner, Robert J McKinlay, Dennehy, Shirley, Williamson, Robert, Vallance, Neil, Mutton, Patricia

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High frequency hearing loss correlated with mutations in the GJB2 gene von WILCOX, S. A, SAUNDERS, K, CONE-WESSON, B, WILLIAMSON, R, DAHL, H.-H. M, OSBORN, A. H, ARNOLD, A, WUNDERLICH, J, KELLY, T, COLLINS, V, WILCOX, L. J, GARDNER, R. J. M, KAMARINOS, M

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Prevalence and nature of connexin 26 mutations in children with non‐syndromic deafness von Dahl, Hans‐Henrik M

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Biopsy and Margins Optimize Outcomes after Thermal Ablation of Colorectal Liver Metastases von Vasiniotis Kamarinos, Nikiforos, Vakiani, Efsevia, Gonen, Mithat, Kemeny, Nancy E, Sigel, Carlie, Saltz, Leonard B, Brown, Karen T, Covey, Anne M, Erinjeri, Joseph P, Brody, Lynn A, Ziv, Etay, Yarmohammadi, Hooman, Kunin, Henry, Barlas, Afsar, Petre, Elena N, Kingham, Peter T, D'Angelica, Michael I, Manova-Todorova, Katia, Solomon, Stephen B, Sofocleous, Constantinos T

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On-current modeling of large-grain polycrystalline silicon thin-film transistors von Farmakis, F.V., Brini, J., Kamarinos, G., Angelis, C.T., Dimitriadis, C.A., Miyasaka, M.

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Immediate post-thermal ablation biopsy of colorectal liver metastases to predict oncologic outcomes von Vasiniotis Kamarinos, Nikiforos, Vakiani, Efsevia, Gonen, Mithat, Kemeny, Nancy E., Covey, Anne M., Brown, Karen T., Brody, Lynn A, Deipolyi, Amy R, Camacho, Juan, Boas, F. Edward, Yarmohammadi, Hooman, Erinjeri, Joseph, Petre, Elena N, Kingham, T. Peter, D'Angelica, Michael Ian, Saltz, Leonard B., Solomon, Stephen Barnett, Sofocleous, Constantinos T.

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Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements von Hatzopoulos, A.T., Arpatzanis, N., Tassis, D.H., Dimitriadis, C.A., Oudwan, M., Templier, F., Kamarinos, G.

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Stability of Amorphous-Silicon and Nanocrystalline Silicon Thin-Film Transistors Under DC and AC Stress von Hatzopoulos, A.T., Arpatzanis, N.., Tassis, D.H., Dimitriadis, C.A., Templier, F.., Oudwan, M.., Kamarinos, G..

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Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors von Angelis, C. T., Dimitriadis, C. A., Miyasaka, M., Farmakis, F. V., Kamarinos, G., Brini, J., Stoemenos, J.

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Effect of Channel Width on the Electrical Characteristics of Amorphous/Nanocrystalline Silicon Bilayer Thin-Film Transistors von Hatzopoulos, Argyrios T., Arpatzanis, Nikolaos, Tassis, Dimitrios H., Dimitriadis, Charalabos A., Templier, Franois, Oudwan, Maher, Kamarinos, George

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Effect of Channel Width Shortening on the Stability of a-Si:H/nc-Si:H Bilayer Thin-Film Transistors von Pappas, I., Dimitriadis, C.A., Siskos, S., Templier, F., Oudwan, M., Kamarinos, G.

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Stability of n -channel a - Si : H ∕ nc - Si : H bilayer thin-film transistors under dynamic stress von Hatzopoulos, A. T., Tassis, D. H., Arpatzanis, N., Dimitriadis, C. A., Templier, F., Oudwan, M., Kamarinos, G.

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Two dimensional simulation and modeling of the electrical behavior in nanocrystalline silicon thin-film transistors von Archontas, N., Georgoulas, N., Dimitriadis, C. A., Templier, F., Oudwan, M., Kamarinos, G.

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Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors von Dimitriadis, C.A, Kimura, M, Miyasaka, M, Inoue, S, Farmakis, F.V, Brini, J, Kamarinos, G

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Electrical and noise characterization of bottom-gated nanocrystalline silicon thin-film transistors von Hatzopoulos, A. T., Arpatzanis, N., Tassis, D. H., Dimitriadis, C. A., Templier, F., Oudwan, M., Kamarinos, G.

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Degradation of n-channel a-Si:H/nc-Si:H bilayer thin-film transistors under DC electrical stress von Arpatzanis, N., Hatzopoulos, A.T., Tassis, D.H., Dimitriadis, C.A., Templier, F., Oudwan, M., Kamarinos, G.

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1/ f noise characterization of amorphous/nanocrystalline silicon bilayer thin-film transistors von Hatzopoulos, A.T., Arpatzanis, N., Tassis, D.H., Dimitriadis, C.A., Templier, F., Oudwan, M., Kamarinos, G.

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Above-threshold drain current model including band tail states in nanocrystalline silicon thin-film transistors for circuit implementation von Pappas, I., Dimitriadis, C. A., Templier, F., Oudwan, M., Kamarinos, G.

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Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors von Angelis, C. T., Dimitriadis, C. A., Farmakis, F. V., Brini, J., Kamarinos, G., Miyasaka, M.

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