Radius-dependent homogeneous strain in uncoalesced GaN nanowires von Calabrese, G., van Treeck, D., Kaganer, V.M., Konovalov, O., Corfdir, P., Sinito, C., Geelhaar, L., Brandt, O., Fernández-Garrido, S.

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X-ray diffraction peak profiles from threading dislocations in GaN epitaxial films von KAGANER, V. M, BRANDT, O, TRAMPERT, A, PLOOG, K. H

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Strained islands as step bunches: shape and growth kinetics von Kaganer, V.M., Ploog, K.H.

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Micromechanics of MnAs nanocrystals embedded in GaAs von MORENO, M, KAGANER, V. M, JENICHEN, B, TRAMPER, A, DÄWERITZ, L, PLOOG, K. H

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Periodic array of misfit dislocations at the MnAs/GaAs interface studied by synchrotron x-ray diffraction von SATAPATHY, D. K, KAGANER, V. M, JENICHEN, B, BRAUN, W, DÄWERITZ, L, PLOOG, K. H

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Layer-by-layer growth of thin epitaxial Fe3Si films on GaAs (001) von JENICHEN, B, KAGANER, V. M, BRAUN, W, HERFORT, J, SHAYDUK, R, PLOOG, K. H

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Post-deposition growth kinetics of Ge on Ge(0 0 1) von Tinkham, B.P., Jenichen, B., Kaganer, V.M., Shayduk, R., Braun, W., Ploog, K.H.

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Layer-by-layer growth of thin epitaxial Fe 3Si films on GaAs (001) von Jenichen, B., Kaganer, V.M., Braun, W., Herfort, J., Shayduk, R., Ploog, K.H.

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Tilted phases of fatty acid monolayers von Kaganer, V. M., Peterson, I. R., Kenn, R. M., Shih, M. C., Durbin, M., Dutta, P.

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Bragg diffraction in a coherent X-ray scattering experiment von Kaganer, V.M, Jenichen, B, Ploog, K.H

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Chirality effects on 2D phase transitions von Scalas, E., Brezesinski, G., Möhwald, H., Kaganer, V.M., Bouwman, W.G., Kjaer, K.

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Effect of roughness correlations in multilayers on Bragg peaks in X-ray diffuse scattering von Kaganer, V.M., Stepanov, S.A., Köhler, R.

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Study of microdefects and their distribution in dislocation-free Si-doped HB GaAs by X-ray diffuse scattering on triple-crystal diffractometer von Charniy, L.A., Morozov, A.N., Bublik, V.T., Scherbachev, K.D., Stepantsova, I.V., Kaganer, V.M.

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Long-range order in thin epitaxial Fe{sub 3}Si films grown on GaAs(001) von Jenichen, B., Kaganer, V.M., Herfort, J., Satapathy, D.K., Schoenherr, H.P., Braun, W., Ploog, K.H.

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Terrace and reconstruction dynamics on the growing GaAs[001] surface studied by synchrotron X-ray diffraction von Braun, W., Jenichen, B., Kaganer, V.M., Shtukenherg, A.G., Daweritz, L., Ploog, K.H.

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Plane-wave X-ray images of dislocations parallel to the diffraction vector von Indenbom, V. L., Kaganer, V. M., Möhling, W., Suvorov, E. V.

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METHOD OF DETECTING FLAWS IN SINGLE CRYSTALS von KAGANER V.M.,SU, INDENBOM V.L.,SU

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Одноперая коронка для мелкошпурового бурения von KAGANER V.M, BAZHAN A.P

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METHOD OF DETECTING FLAWS IN SINGLE CRYSTALS von KAGANER V.M.,SU, INDENBOM V.L.,SU, KUSHNIR V.I.,SU

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Установка для улавливания пыли von KAGANER V.M, ONISHSHENKO V.M, MIKHELSON M.L, DERYAGIN B.V, DUKHIN S.S

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