Observation of zero creep in piezoelectric actuators von KOOPS, K. R, SCHOLTE, P. M. L. O, DE KONING, W. L

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Intercomparison of scanning probe microscopes von Breil, R, Fries, T, Garnaes, J, Haycocks, J, Hüser, D, Joergensen, J, Kautek, W, Koenders, L, Kofod, N, Koops, K.R, Korntner, R, Lindner, B, Mirandé, W, Neubauer, A, Peltonen, J, Picotto, G.B, Pisani, M, Rothe, H, Sahre, M, Stedman, M, Wilkening, G

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Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster von Hemmes, K, Hamstra, M.A, Koops, K.R, Wind, M.M, Schram, T, de Laet, J, Bender, H

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Design and construction of a high-resolution 3D translation stage for metrological applications von Koops, K.R., Banning, R., Scholte, P.M.L.O., Heerens, W.C., Adriaens, J.M.T.A., de Koning, W.L.

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Ellipsometer with two lasers von K. HEMMES, K.R. KOOPS

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Iodine-stabilized Nd:YVO/sub 4/ laser with digital controller von van den Berg, S.A., Koops, K.R.

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A holographic ruler for simple measurements in opaque reflection holograms (dental study model storage) von Koops, K.R., Althof, V.G.M., ten Bosch, J.J.

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