Similarities between pandemics and cancer in growth and risk models von Vandamme, Lode K. J., de Hingh, Ignace H. J. T., Fonseca, Jorge, Rocha, Paulo R. F.

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Cancer Survival Data Representation for Improved Parametric and Dynamic Lifetime Analysis von Vandamme, Lode K J, Wouters, Peter A A F, Slooter, Gerrit D, de Hingh, Ignace H J T

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Electrochemical noise and impedance of Au electrode/electrolyte interfaces enabling extracellular detection of glioma cell populations von Rocha, Paulo R. F., Schlett, Paul, Kintzel, Ulrike, Mailänder, Volker, Vandamme, Lode K. J., Zeck, Gunther, Gomes, Henrique L., Biscarini, Fabio, de Leeuw, Dago M.

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Noise spectroscopy of tunable nanoconstrictions: molecule-free and molecule-modified von Handziuk, Volodymyr, Gasparyan, Ferdinand, Vandamme, Lode K J, Coppola, Maristella, Sydoruk, Viktor, Petrychuk, Mykhailo, Mayer, Dirk, Vitusevich, Svetlana

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Ion-driven communication and acclimation strategies in microalgae von Amaral, Raquel, Duci, Damiano, Cotta, Francisco C., Bacellar, Felipe L., Oliveira, Soraia, Verret, Frédéric, Asadi, Kamal, Vandamme, Lode K.J., Reis, Nuno M., Bryant, Lee D., Tosh, David, Mouget, Jean-Luc, Perkins, Rupert, Rocha, Paulo R.F.

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Analysis and Simulation of Epidemic COVID-19 Curves with the Verhulst Model Applied to Statistical Inhomogeneous Age Groups von Vandamme, Lode K. J., Rocha, Paulo R. F.

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Collective electrical oscillations of a diatom population induced by dark stress von Rocha, Paulo R. F., Silva, Alexandra D., Godinho, Lia, Dane, Willem, Estrela, Pedro, Vandamme, Lode K. J., Pereira-Leal, Jose B., de Leeuw, Dago M., Leite, Ricardo B.

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Low-Frequency Diffusion Noise in Resistive-Switching Memories Based on Metal-Oxide Polymer Structure von Rocha, Paulo R. F., Gomes, Henrique Leonel, Vandamme, Lode K. J., Chen, Qian, Kiazadeh, Asal, de Leeuw, Dago M., Meskers, Stefan C. J.

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Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors von Nenadovic, N., Mijalkovic, S., Nanver, L.K., Vandamme, L.K.J., d'Alessandro, V., Schellevis, H., Slotboom, J.W.

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Possible Correlation between Flicker Noise and Bias Temperature Stress von Wagner, Paul-Jurgen, Aichinger, Thomas, Grasser, Tibor, Nelhiebel, Michael, Vandamme, Lode K J

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1/f noise in MODFETs at low drain bias von Peransin, J.-M., Vignaud, P., Rigaud, D., Vandamme, L.K.J.

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Low frequency gate noise in a diode-connected MESFET: measurements and modeling von Lambert, B., Malbert, N., Verdier, F., Labat, N., Touboul, A., Vandamme, L.K.J.

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Bulk and surface 1/f noise von Vandamme, L.K.J.

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Low Frequency Gate Noise in a Diode-Connected MESFET: Measurements and Modeling von Lambert, Benoit, Malbert, Nathalie, Labat, Nathalie, Verdier, Frédéric, Touboul, Andre, K.J. Vandamme, Lode

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Low-frequency intensity noise in semiconductor lasers von Fronen, R.J., Vandamme, L.K.J.

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1/f noise in short n-p+ diffusion-current-dominated (HgCd)Te avalanche photodiodes von VANDAMME, L. K. J, ORSAL, B

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Gate current 1/f noise in GaAs MESFET's von Vandamme, L.K.J., Rigaud, D., Peransin, J.-M., Alabedra, R., Dumas, J.-M.

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Effects of RF life-test on LF electrical parameters of GaAs power MESFETs von Malbert, Nathalie, Lambert, Benoit, Maneux, Cristell, Labat, Nathalie, Touboul, Andre, Danto, Yves, K.J. Vandamme, Lode, Huguet, Pierre, Auxemery, P., Garat, François

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