Environmental radiation impact on lifetimes and quasiparticle tunneling rates of fixed-frequency transmon qubits von Gordon, R. T., Murray, C. E., Kurter, C., Sandberg, M., Hall, S. A., Balakrishnan, K., Shelby, R., Wacaser, B., Stabile, A. A., Sleight, J. W., Brink, M., Rothwell, M. B., Rodbell, K. P., Dial, O., Steffen, M.

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Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground von Gordon, M.S., Goldhagen, P., Rodbell, K.P., Zabel, T.H., Tang, H.H.K., Clem, J.M., Bailey, P.

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Quasiparticle tunneling as a probe of Josephson junction barrier and capacitor material in superconducting qubits von Kurter, C., Murray, C. E., Gordon, R. T., Wymore, B. B., Sandberg, M., Shelby, R. M., Eddins, A., Adiga, V. P., Finck, A. D. K., Rivera, E., Stabile, A. A., Trimm, B., Wacaser, B., Balakrishnan, K., Pyzyna, A., Sleight, J., Steffen, M., Rodbell, K.

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Hardness Assurance for Proton Direct Ionization-Induced SEEs Using a High-Energy Proton Beam von Dodds, N. A., Schwank, J. R., Shaneyfelt, M. R., Dodd, P. E., Doyle, B. L., Trinczek, M., Blackmore, E. W., Rodbell, K. P., Gordon, M. S., Reed, R. A., Pellish, J. A., LaBel, K. A., Marshall, P. W., Swanson, S. E., Vizkelethy, G., Van Deusen, S., Sexton, F. W., Martinez, M. J.

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Mechanisms for microstructure evolution in electroplated copper thin films near room temperature von Harper, J. M. E., Cabral, C., Andricacos, P. C., Gignac, L., Noyan, I. C., Rodbell, K. P., Hu, C. K.

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New Insights Gained on Mechanisms of Low-Energy Proton-Induced SEUs by Minimizing Energy Straggle von Dodds, N. A., Dodd, P. E., Shaneyfelt, M. R., Sexton, F. W., Martinez, M. J., Black, J. D., Marshall, P. W., Reed, R. A., McCurdy, M. W., Weller, R. A., Pellish, J. A., Rodbell, K. P., Gordon, M. S.

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Porosity in plasma enhanced chemical vapor deposited SiCOH dielectrics: A comparative study von Grill, A., Patel, V., Rodbell, K. P., Huang, E., Baklanov, M. R., Mogilnikov, K. P., Toney, M., Kim, H.-C.

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On the use of alloying elements for Cu interconnect applications von Barmak, K., Cabral, C., Rodbell, K. P., Harper, J. M. E.

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An Evaluation of An Ultralow Background Alpha-Particle Detector von Gordon, M.S., Heidel, D.F., Rodbell, K.P., Dwyer-McNally, B., Warburton, W.K.

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Single-Event Upsets and Multiple-Bit Upsets on a 45 nm SOI SRAM von Heidel, D.F., Marshall, P.W., Pellish, J.A., Rodbell, K.P., LaBel, K.A., Schwank, J.R., Rauch, S.E., Hakey, M.C., Berg, M.D., Castaneda, C.M., Dodd, P.E., Friendlich, M.R., Phan, A.D., Seidleck, C.M., Shaneyfelt, M.R., Xapsos, M.A.

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Flip-Flop Upsets From Single-Event-Transients in 65 nm Clock Circuits von Wissel, L., Heidel, D.F., Gordon, M.S., Rodbell, K.P., Stawiasz, K., Cannon, E.H.

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Single-Event-Upset Critical Charge Measurements and Modeling of 65 nm Silicon-on-Insulator Latches and Memory Cells von Heidel, D.F., Rodbell, K.P., Oldiges, P., Gordon, M.S., Tang, H.H.K., Cannon, E.H., Plettner, C.

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Underlayer effects on texture evolution in copper films von Murray, C.E., Rodbell, K.P., Vereecken, P.M.

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Studies of deformation-induced texture development in sheet materials using diffraction techniques von Banovic, S.W., Vaudin, M.D., Gnaeupel-Herold, T.H., Saylor, D.M., Rodbell, K.P

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Low-Energy Proton-Induced Single-Event-Upsets in 65 nm Node, Silicon-on-Insulator, Latches and Memory Cells von Rodbell, K.P., Heidel, D.F., Tang, H.H.K., Gordon, M.S., Oldiges, P., Murray, C.E.

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The role of texture in the electromigration behavior of pure aluminum lines von Knorr, D. B., Rodbell, K. P.

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Positron Annihilation Techniques Suited for Porosity Characterization of Thin Films von Petkov, M. P., Wang, C. L., Weber, M. H., Lynn, K. G., Rodbell, K. P.

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Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM von Heidel, D.F., Marshall, P.W., LaBel, K.A., Schwank, J.R., Rodbell, K.P., Hakey, M.C., Berg, M.D., Dodd, P.E., Friendlich, M.R., Phan, A.D., Seidleck, C.M., Shaneyfelt, M.R., Xapsos, M.A.

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Evolution of microstructure in Ti–Ta bilayer thin films on polycrystalline-Si and Si(001) von Özcan, A.S., Ludwig, Jr, K.F., Lavoie, C., Basu, S.N., Coia, C., Cabral, Jr, C., Rodbell, K.P., Harper, J.M.E.

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Ultra Low Contact Resistivities for CMOS Beyond 10-nm Node von Zhen Zhang, Koswatta, S. O., Bedell, S. W., Baraskar, A., Guillorn, M., Engelmann, S. U., Yu Zhu, Gonsalves, J., Pyzyna, A., Hopstaken, M., Witt, C., Li Yang, Fei Liu, Newbury, J., Wei Song, Cabral, C., Lofaro, M., Ozcan, A. S., Raymond, M., Lavoie, C., Sleight, J. W., Rodbell, K. P., Solomon, P. M.

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