Franck–Hertz effect in cathodo- and photoluminescence of wide-gap materials von Lushchik, Aleksandr, Lushchik, Cheslav, Kärner, Tiit, Liblik, Peeter, Nagirnyi, Vitali, Shablonin, Evgeni, Shugai, Anna, Vasil'chenko, Evgeni

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Dependence of long-lived defect creation on excitation density in MgO single crystals von Lushchik, Aleksandr, Kärner, Tiit, Lushchik, Cheslav, Vasil'chenko, Eugene, Dolgov, Sergei, Issahanyan, Vigen, Liblik, Peeter

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Some aspects of radiation resistance of wide-gap metal oxides von Lushchik, Aleksandr, Feldbach, Eduard, Galajev, Semjon, Kärner, Tiit, Liblik, Peeter, Lushchik, Cheslav, Maaroos, Aarne, Nagirnyi, Vitali, Vasil’chenko, Evgeni

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Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties von Kropman, Daniel, Kärner, Tiit, Dolgov, Sergei, Heinmaa, Ivo, Laas, Tõnu, Londos, Charalampos A.

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Interaction of point defects with impurities in the Si‐SiO 2 system and its influence on the interface properties von Kropman, Daniel, Kärner, Tiit, Dolgov, Sergei, Heinmaa, Ivo, Laas, Tõnu, Londos, Charalampos A.

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Point Defects Generation Kinetics in the Si-SiO2 System and its Influence on the Interface Properties von Londos, Charalamos A., Kärner, Tiit, Dolgov, Sergei, Heinmaa, Ivo, Kropman, Daniel

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Dedicated in the Memory of Professor Ulrich Gösele. Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Interface Properties von Kropman, Daniel, Kärner, Tiit, Dolgov, Sergei, Heinmaa, Ivo, Londos, C.A.

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Stress Relaxation Mechanism by Strain in the Si-SiO2 System and its Influence on the Interface Properties von Mellikov, Enn, Dauksta, Edvins, Laas, Tõnu, Onufrijevs, Pavels, Medvid, Arthur, Kärner, Tiit, Kropman, Daniel

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Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Interface Properties von Mellikov, Enn, Laas, Tõnu, Londos, Charalampos A., Kärner, Tiit, Misiuk, Andrzej, Heinmaa, Ivo, Kropman, Daniel

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Interaction of Point Defects with Impurities in the Si-SiO2 System and its Influence on the Properties of the Interface von Ozerov, M., Medvid, Arthur, Cizmar, E., Kärner, Tiit, Skorupa, Wolfgang, Prucnal, S., Kropman, Daniel, Zvyagin, S., Mellikov, E., Lott, K., Woznitsa, J., Heinmaa, Ivo, Laas, Tony

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Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and its Influence on the Interface Properties von Ugaste, Ü., Mellikov, E., Medvid, Arthur, Kärner, Tiit, Abru, U., Laas, Tony, Heinmaa, Ivo, Kropman, Daniel

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Point Defects Interaction with Extended Defects and Impurities and Its Influence on the Si-SiO2 System Properties von Samoson, A., Mellikov, E., Medvid, Arthur, Kärner, Tiit, Kauk, M., Ugaste, U., Abru, U., Heinmaa, Ivo, Kropman, Daniel

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Impurity Gettering Investigation in the Si-SiO2 System von Kärner, Tiit, Tambek, L., Poll, V., Strik, M., Abru, U., Kropman, Daniel

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On Point Defect Gettering by Back-Side Damage in the Si-SiO2 System von Dolgov, S., Kärner, Tiit, Kropman, Daniel

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Interaction of Point Defects with Extended Defects in the Si-SiO2 System during its Formation Process von Ugaste, Ü., Kärner, Tiit, Strik, M., Abru, U., Mellikov, E., Kropman, Daniel

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Ultrastructural localization of adenylate cyclase and cAMP phosphodiesterase in the gastrulating chick embryo von Neuman, Toomas, Laasberg, Tiit, K rner, J ri

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