Interface characterization and current conduction in HfO2-gated MOS capacitors von CHEN, H. W, CHIU, F. C, LIU, C. H, CHEN, S. Y, HUANG, H. S, JUAN, P. C, HWANG, H. L

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Lipase-catalyzed acylation of levoglucosan in continuous flow: antibacterial and biosurfactant studies von do Nascimento, Marcelo A, Vargas, Juan P C, Rodrigues, José G A, Leão, Raquel A C, de Moura, Patricia H B, Leal, Ivana C R, Bassut, Jonathan, de Souza, Rodrigo O M A, Wojcieszak, Robert, Itabaiana, Jr, Ivaldo

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Ferroelectric of HfO 2 dielectric layer sputtered with TiN or ZrN for sandwich-like metal-insulator-metal capacitors von Juan, P.C., Lin, K.C., Chu, H.Y., Kuo, Y.C., Wang, H.W., Shih, T.Y.

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Ferroelectric of HfO2 dielectric layer sputtered with TiN or ZrN for sandwich-like metal-insulator-metal capacitors von Juan, P.C., Lin, K.C., Chu, H.Y., Kuo, Y.C., Wang, H.W., Shih, T.Y.

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Leakage current mechanism and effect of Y2O3 doped with Zr high-K gate dielectrics von Lin, K.C., Juan, P.C., Liu, C.H., Wang, M.C., Chou, C.H.

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The influence of lanthanum doping position in ultra-thin HfO 2 films for high-k gate dielectrics von Liu, C.H., Juan, P.C., Lin, J.Y.

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The influence of lanthanum doping position in ultra-thin HfO2 films for high-k gate dielectrics von Liu, C.H., Juan, P.C., Lin, J.Y.

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The effect of ZrN antidiffusion capping layer on the electrical and physical properties of metal-gate/ZrN/Zr-graded Dy2O3/Si MIS nanolaminated structures von Juan, P.C., Liu, C.H., Lin, C.L., Mong, F.C., Huang, J.H.

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Effects of zirconium substitution on the electrical and physical properties of metal-ferroelectric (BiFeO3)-insulator (HfO2)-silicon structures for non-volatile memories von Juan, P.C., Sun, C.L., Liu, C.H., Lin, C.L., Mong, F.C., Huang, J.H., Chang, H.S.

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Interface characterization and current conduction in HfO 2-gated MOS capacitors von Chen, H.W., Chiu, F.C., Liu, C.H., Chen, S.Y., Huang, H.S., Juan, P.C., Hwang, H.L.

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Monitorización neurofisiológica intraoperatoria en cirugía de columna von Antonia Henríquez A., Joel Marchant K., Francisco Aracena C., Juan P. Cabrera C.

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Optimization of BiFeO3MFIS Capacitors Doped Niobium by Using Taguchi Method von Chou, C.H., Ko, C.H., Lin, K.C., Juan, P.C., Sekiguchi, H., Twu, M.J.

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The effect of electrode material on the electrical conduction of metal-Pb(Zr 0.53Ti 0.47)O 3-metal thin film capacitors von Juan, P.C., Chou, H.C., Lee, J.Y.M.

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The effect of electrode material on the electrical conduction of metal-Pb(Zr0.53Ti0.47)O3-metal thin film capacitors von JUAN, P. C, CHOU, H. C, LEE, J. Y. M

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Accidente por animales ponzoñosos y venenosos. Su impacto en la salud ocupacional en Colombia von Gómez C., Juan P.

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The effect of annealing temperature on the electrical properties of metal-ferroelectric (PbZr 0.53Ti 0.47O 3)-insulator (ZrO 2)-semiconductor (MFIS) thin-film capacitors von Juan, P.C., Jiang, J.D., Shih, W.C., Lee, J.Y.M.

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Lack of efficacy of standard doses of ivermectin in severe COVID-19 patients von Camprubí, Daniel, Almuedo-Riera, Alex, Martí-Soler, Helena, Soriano, Alex, Hurtado, Juan Carlos, Subirà, Carme, Grau-Pujol, Berta, Krolewiecki, Alejandro, Muñoz, Jose

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声辩弗兰克·斯特拉晚期作品 von P.C.史密斯 汪溪涓

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Power management techniques for grid-connected DC microgrids: A comparative evaluation von dos Santos Neto, Pedro J., Barros, Tárcio A.S., Silveira, Joao P.C., Ruppert Filho, Ernesto, Vasquez, Juan C., Guerrero, Josep M.

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Somatic calreticulin mutations in patients with Budd-Chiari syndrome and portal vein thrombosis von Plompen, Elisabeth P C, Valk, Peter J M, Chu, Isabel, Darwish Murad, Sarwa Darwish, Plessier, Aurelie, Turon, Fanny, Trebicka, Jonel, Primignani, Massimo, Garcia-Pagán, Juan Carlos, Valla, Dominique C, Janssen, Harry L A, Leebeek, Frank W G

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