Scanning Electron Microscopy for Quantitative Small and Large Deformation Measurements Part I. SEM Imaging at Magnifications from 200 to 10,000 von SUTTON, M. A, LI, N, JOY, D. C, REYNOLDS, A. P, LI, X

Volltext

SMART – a program to measure SEM resolution and imaging performance von Joy, D. C.

Volltext

Controlling resist thickness and etch depth for fabrication of 3D structures in electron-beam grayscale lithography von Kim, J., Joy, D.C., Lee, S.-Y.

Volltext

Scanning electron microscope imaging in liquids – some data on electron interactions in water von JOY, D. C., JOY, C. S.

Volltext

Biological serial block face scanning electron microscopy at improved z-resolution based on Monte Carlo model von He, Q., Hsueh, M., Zhang, G., Joy, D. C., Leapman, R. D.

Volltext

Experimental secondary electron spectra under SEM conditions von JOY, D. C., PRASAD, M. S., MEYER, H. M.

Volltext

Monte Carlo modeling of ion beam induced secondary electrons von Huh, U., Cho, W., Joy, D.C.

Volltext

Modeling ion-solid interactions for imaging applications von Joy, D.C., Michael, J.R.

Volltext

Oliver Wells (1931-2013) A Brief Memorial von Joy, D. C., Gignac, L.

Volltext

Nanoscale electron-beam-stimulated processing von Rack, P. D., Randolph, S., Deng, Y., Fowlkes, J., Choi, Y., Joy, D. C.

Volltext

Scanning Electron Microscopy and X-Ray Microanalysis von Goldstein, Joseph I, Newbury, Dale E, Michael, Joseph R, Ritchie, Nicholas W. M, Scott, John Henry J, Joy, David C

Volltext

Diverse and conserved nano‐ and mesoscale structures of diatom silica revealed by atomic force microscopy von HILDEBRAND, M., HOLTON, G., JOY, D.C., DOKTYCZ, M.J., ALLISON, D.P.

Volltext

Experimental resolution measurement in critical dimension scanning electron microscope metrology von Lorusso, G. F., Joy, D. C.

Volltext

Investigation of Image Contrast of Energy-Filtered BSE Image at Ultra Low Voltage von Hashimoto, Y., Muto, A., Walters, T., Woods, E., Joy, D. C.

Volltext

Modeling Ion Beam Induced Secondary Electrons von Huh, U., Iberi, V., Cho, W., Ramachandra, R., Joy, D. C.

Volltext

Monte Carlo Modeling of Ion Beam Induced Secondary Electrons von Huh, U., Cho, W., Ramachandra, R., Joy, D. C.

Volltext

Ollie was Right! A Review of Angular Dependence, Detector Bandwidth and Sample Preparation on Contrast in Secondary and Backscattered Electron Images in the SEM von Griffin, B.J., Joy, D.C., Michael, J.R.

Volltext

Characterization of hydrogen responsive nanoporous palladium films synthesized via a spontaneous galvanic displacement reaction von Patton, J F, Lavrik, N V, Joy, D C, Hunter, S R, Datskos, P G, Smith, D B, Sepaniak, M J

Volltext

Modeling for Multi-Beam Microscopy von Joy, D.C., Ramachandra, R., Joy, D., Griffin, B.

Volltext

ELECTRON HOLOGRAPHIC STUDY OF FERROELECTRIC DOMAIN-WALLS von ZHANG, HASHIMOTO, T, JOY, DC

Volltext