Leakage Control in 0.4-nm EOT Ru/SrTiOx/Ru Metal-Insulator-Metal Capacitors: Process Implications von Swerts, Johan, Popovici, Mihaela, Kaczer, Ben, Aoulaiche, Marc, Redolfi, Augusto, Clima, Sergiu, Caillat, Christian, Wan Chih Wang, Afanasev, Valeri V., Jourdan, Nicolas, Olk, Christina, Hody, Hubert, Van Elshocht, Sven, Jurczak, Malgorzata

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On the analysis of indirect proofs: Contradiction and contraposition von Jourdan, Nicolas, Yevdokimov, Oleksiy

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Numerical simulation of hydrodynamics in wet cooling tower packings von Jourdan, Nicolas, Kanniche, Mohamed, Neveux, Thibaut, Potier, Olivier

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Experimental Characterization of Liquid Flows in Cooling Tower Packing von Jourdan, Nicolas, Kanniche, Mohamed, Neveux, Thibaut, Potier, Olivier

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Compartmental Modelling in chemical engineering: A critical review von Jourdan, Nicolas, Neveux, Thibaut, Potier, Olivier, Kanniche, Mohamed, Wicks, Jim, Nopens, Ingmar, Rehman, Usman, Le Moullec, Yann

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SSMSPC: self-supervised multivariate statistical in-process control in discrete manufacturing processes von Biegel, Tobias, Helm, Patrick, Jourdan, Nicolas, Metternich, Joachim

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Virtual sensors for erroneous data repair in manufacturing a machine learning pipeline von Sen, Sagar, Husom, Erik Johannes, Goknil, Arda, Politaki, Dimitra, Tverdal, Simeon, Nguyen, Phu, Jourdan, Nicolas

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Experimental characterization of liquid flows in cooling tower fill packing von Jourdan, Nicolas, Kanniche, Mohamed, Neveux, Thibaut, Potier, Olivier

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Compartmental Modeling of Biofouling in Industrial Cooling Circuits von Jourdan, Nicolas, Kanniche, Mohamed, Neveux, Thibaut, Potier, Olivier

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Multi-source data modelling and graph neural networks for predictive quality von Cassoli, Beatriz Bretones, Jourdan, Nicolas, Metternich, Joachim

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Virtual sensors for erroneous data repair in manufacturing a machine learning pipeline von Sen, Sagar, Husom, Erik Johannes, Goknil, Arda, Politaki, Dimitra, Tverdal, Simeon, Nguyen, Phu Hong, Jourdan, Nicolas

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Data-driven long-term condition-based maintenance using anomaly detection under concept drift: A case study of an ultrasonic sieve machine von Zhua, Feng, Jourdan, Nicolas, Cassoli, Beatriz Bretones, Metternich, Joachim

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A new benchmark dataset for machine learning applications in discrete manufacturing: CiP-DMD von Jourdan, Nicolas, Biegel, Tobias, Cassoli, Beatriz Bretones, Metternich, Joachim

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Handling concept drift in deep learning applications for process monitoring von Jourdan, Nicolas, Bayer, Tom, Biegel, Tobias, Metternich, Joachim

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Overview of Ruthenium Thin Films Annealed by Microsecond Scanning UV Pulsed Laser: Structural, Electrical, and Failure Modes Analysis von Daubriac, Richard, Cancellara, Leonardo, Chehadi, Zeinab, Lu, Lu, Thuries, Louis, Khaled, Mohamed Ali, Roze, Fabien, Jourdan, Nicolas, Tokei, Zsolt, Descamps‐Mandine, Armel, Hungria, Teresa, Fazzini, Pier‐Francesco, Tabata, Toshiyuki, Huet, Karim

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Deep learning for multivariate statistical in-process control in discrete manufacturing: A case study in a sheet metal forming process von Biegel, Tobias, Jourdan, Nicolas, Hernandez, Carlos, Cviko, Amir, Metternich, Joachim

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Frameworks for data-driven quality management in cyber-physical systems for manufacturing: A systematic review von Cassoli, Beatriz Bretones, Jourdan, Nicolas, Nguyen, Phu H., Sen, Sagar, Garcia-Ceja, Enrique, Metternich, Joachim

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Impact of silica-substrate chemistry on tantalum nitride thin films deposited by atomic layer deposition: Microstructure, chemistry and electrical behaviors von Volpi, Fabien, Cadix, Lionel, Berthomé, Gregory, Coindeau, Stéphane, Encinas, Thierry, Jourdan, Nicolas, Blanquet, Elisabeth

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On The Reliability Of Machine Learning Applications In Manufacturing Environments von Jourdan, Nicolas, Sen, Sagar, Husom, Erik Johannes, Garcia-Ceja, Enrique, Biegel, Tobias, Metternich, Joachim

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Long Range Object-Level Monocular Depth Estimation for UAVs von Silva, David, Jourdan, Nicolas, Gählert, Nils

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