Robustness of sampled-data homogeneous systems von Josse, Florence, Bernuau, Emmanuel, Moulay, Emmanuel, Coirault, Patrick

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(Invited) 14nm FDSOI Technology for High-Speed and Energy-Efficient CMOS von Weber, Olivier, Josse, Emmanuel, Haond, Michel

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In depth characterization of electron transport in 14 nm FD-SOI CMOS devices von Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard

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Probabilistic prediction of arrivals and hospitalizations in emergency departments in Île-de-France von Susmann, Herbert, Chambaz, Antoine, Josse, Julie, Aegerter, Philippe, Wargon, Mathias, Bacry, Emmanuel

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All Operation Region Characterization and Modeling of Drain and Gate Current Mismatch in 14-nm Fully Depleted SOI MOSFETs von Karatsori, Theano A., Theodorou, Christoforos G., Josse, Emmanuel, Dimitriadis, Charalabos A., Ghibaudo, G.

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66‐1: High Resolution Quantum Dot Global Shutter Imagers von Steckel, Jonathan S., Pattantyus-Abraham, Andras G., Josse, Emmanuel, Mazaleyrat, Eric, Rochereau, Krysten

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Low temperature characterization of mobility in 14 nm FD-SOI CMOS devices under interface coupling conditions von Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard

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Full split C–V method for parameter extraction in ultra thin BOX FDSOI MOS devices von Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard

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In depth characterization of electron transport in 14nm FD-SOI CMOS devices von Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard

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Magnetoresistance mobility characterization in advanced FD-SOI n-MOSFETs von Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Mukhopadhyay, Sutirha, Piot, Benjamin, Kim, Gyu-Tae, Ghibaudo, Gérard

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Low temperature characterization of mobility in 14nm FD-SOI CMOS devices under interface coupling conditions von Shin, Minju, Shi, Ming, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Kim, Gyu-Tae, Ghibaudo, Gérard

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Modeling local electrical fluctuations in 45 nm heavily pocket-implanted bulk MOSFET von Mezzomo, Cecilia M., Bajolet, Aurelie, Cathignol, Augustin, Josse, Emmanuel, Ghibaudo, Gérard

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Modeling local electrical fluctuations in 45nm heavily pocket-implanted bulk MOSFET von Mezzomo, Cecilia M., Bajolet, Aurelie, Cathignol, Augustin, Josse, Emmanuel, Ghibaudo, Gérard

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Experimental and Theoretical Investigation of Magnetoresistance From Linear Regime to Saturation in 14-nm FD-SOI MOS Devices von Minju Shin, Ming Shi, Mouis, Mireille, Cros, Antoine, Josse, Emmanuel, Mukhopadhyay, Sutirtha, Piot, Benjamin, Gyu-Tae Kim, Ghibaudo, Gerard

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In vivo evaluation of sunscreen application by multispectral imaging: A new tool for educating sunscreen users von Le Digabel, Jimmy, Questel, Emmanuel, Lauze, Christophe, Carballido, Fabienne, Josse, Gwendal

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(Invited) UTBB FDSOI PMOSFETs Including Strained SiGe Channels at the 14nm Technology Node and Beyond von Andrieu, François, Berthelon, Remy, Morvan, Simeon, Gourhant, Olivier, Baylac, Elise, Le Royer, Cyrille, Dutartre, Didier, Josse, Emmanuel, Haond, Michel

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The use of suction blisters to measure sunscreen protection against UVR-induced DNA damage von Josse, Gwendal, Douki, Thierry, Le Digabel, Jimmy, Gravier, Eleonore, Questel, Emmanuel

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ELECTRICAL CONNECTION AND ITS METHOD OF FABRICATION von JOSSE, Emmanuel, INARD, Alain

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Connexion électrique et son procédé de fabrication von JOSSE, Emmanuel, INARD, Alain

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(Invited) 14nm FDSOI Technology for High-Speed and Energy-Efficient CMOS von Weber, Olivier, Josse, Emmanuel, Haond, Michel

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