Universal tunneling behavior in technologically relevant P/N junction diodes von Solomon, Paul M., Jopling, Jason, Frank, David J., D’Emic, Chris, Dokumaci, O., Ronsheim, P., Haensch, W. E.

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Reliability for manufacturing on 45nm logic technology with high-k + metal gate transistors and Pb-free packaging von Kasim, R., Connor, C., Hicks, J., Jopling, J., Litteken, C.

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On the Effects of Carrier Tunneling on the Capacitance-Voltage Characteristics of Ultrathin-Oxide MOSFETs von Massoud, Hisham, Shen, Mike, Jopling, Jason

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Professionalism of Admitting and Consulting Services and Trauma Patient Outcomes von Cooper, William O., Hickson, Gerald B., Guillamondegui, Oscar D., Cannon, Jeremy W, Charles, Anthony G., Hoth, J. Jason, Alam, Hasan B., Tillou, Areti, Luchette, Frederick A., Skeete, Dionne A., Domenico, Henry J., Meredith, J. Wayne, Brennan, Theresa M. H., Smith, Brian P, Kelz, Rachel R., Biesterveld, Ben E., Busuttil, Ashley, Jopling, Jeffrey K., Hopkins, Joseph R., Emory, Cynthia L., Sullivan, Patricia G., Martin, R. Shayn, Howerton, Russell M., Cryer, Henry M., Davidson, Heather A., Gonzalez, Richard P., Spain, David A.

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Professionalism of Admitting and Consulting Services and Trauma Patient Outcomes von Cooper, William O., Hickson, Gerald B., Guillamondegui, Oscar D., Cannon, Jeremy W., Charles, Anthony G., Hoth, J. Jason, Alam, Hasan B., Tillou, Areti, Luchette, Frederick A., Skeete, Dionne A., Domenico, Henry J., Meredith, J. Wayne, Brennan, Theresa M. H., Smith, Brian P., Kelz, Rachel R., Biesterveld, Ben E., Busuttil, Ashley, Jopling, Jeffrey K., Hopkins, Joseph R., Emory, Cynthia L., Sullivan, Patricia G., Martin, R. Shayn, Howerton, Russell M., Cryer, Henry M., Davidson, Heather A., Gonzalez, Richard P., Spain, David A.

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