Improved analysis and modeling of low-frequency noise in nanoscale MOSFETs von Ioannidis, E.G., Dimitriadis, C.A., Haendler, S., Bianchi, R.A., Jomaah, J., Ghibaudo, G.

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Modeling of low-frequency noise in advanced CMOS devices von Balestra, F., Ghibaudo, G., Jomaah, J.

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Analytical unified threshold voltage model of short-channel FinFETs and implementation von Fasarakis, N., Tsormpatzoglou, A., Tassis, D.H., Dimitriadis, C.A., Papathanasiou, K., Jomaah, J., Ghibaudo, G.

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Gate-induced floating body effect excess noise in partially depleted SOI MOSFETs von Dieudonne, F., Jomaah, J., Balestra, F.

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Coupling effects and channels separation in FinFETs von Daugé, F., Pretet, J., Cristoloveanu, S., Vandooren, A., Mathew, L., Jomaah, J., Nguyen, B.-Y.

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Polysilicon high frequency devices for large area electronics: Characterization, simulation and modeling von Botrel, J.L., Savry, O., Rozeau, O., Templier, F., Jomaah, J.

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Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs von Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.

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Investigation of polarization mechanisms on unibond buried oxide layer von Tsouti, V., Papaioannou, G., Jomaah, J., Balestra, F.

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Static and low frequency noise characterization in surface- and buried-mode 0.1 μm PMOSFETS von Fadlallah, M., Ghibaudo, G., Jomaah, J., Guégan, G.

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Effect of Localized Interface Charge on the Threshold Voltage of Short-Channel Undoped Symmetrical Double-Gate MOSFETs von Ioannidis, E G, Tsormpatzoglou, A, Tassis, D H, Dimitriadis, C A, Ghibaudo, G, Jomaah, J

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Origin of Low-Frequency Noise in the Low Drain Current Range of Bottom-Gate Amorphous IGZO Thin-Film Transistors von Theodorou, C. G., Tsormpatzoglou, A., Dimitriadis, C. A., Khan, S. A., Hatalis, M. K., Jomaah, J., Ghibaudo, G.

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Shrinking from 0.25 down to 0.12 μm SOI CMOS technology node: a contribution to low-frequency noise in partially depleted N-MOSFETs von Dieudonné, F, Haendler, S, Jomaah, J, Balestra, F

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Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors von Haendler, S, Jomaah, J, Ghibaudo, G, Balestra, F

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Analysis and modeling of self-heating effects in thin-film SOI MOSFETs as a function of temperature von Jomaah, J., Ghibaudo, G., Balestra, F.

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On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs von EXARCHOS, M, DIEUDONNE, F, JOMAAH, J, PAPAIOANNOU, G. J, BALESTRA, F

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Static and low frequency noise characterization of surface- and buried-mode 0.1 μm P and N MOSFETs von Fadlallah, M, Ghibaudo, G, Jomaah, J, Zoaeter, M, Guegan, G

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The impact of static and dynamic degradation on SOI “smart-cut” floating body MOSFETs von Exarchos, M.A., Papaioannou, G.J., Jomaah, J., Balestra, F.

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Reliability of ultra-thin film deep submicron SIMOX nMOSFETs von Potavin, O., Haendler, S., Jomaah, J., Balestra, F., Raynaud, C.

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Low frequency noise in multi-gate SOI CMOS devices von Zafari, Leily, Jomaah, Jalal, Ghibaudo, Gérard

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Thorough characterization of deep-submicron surface and buried channel pMOSFETs von Cretu, B., Fadlallah, M., Ghibaudo, G., Jomaah, J., Balestra, F., Guégan, G.

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