Stability of tungsten/carbon and tungsten/silicon multilayer x-ray mirrors under thermal annealing and x-radiation exposure von KORTRIGHT, J. B, JOKSCH, S, ZIEGLER, E

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Cryogenic cooling of monochromators von Marot, G., Rossat, M., Freund, A., Joksch, S., Kawata, H., Zhang, L., Ziegler, E., Berman, L., Chapman, D., Hastings, J. B., Iarocci, M.

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Performance of multilayers in intense synchrotron x‐ray beams von Ziegler, E., Lepêtre, Y., Joksch, S., Saile, V., Mourikis, S., Viccaro, P. J., Rolland, G., Laugier, F.

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Calculated and measured performance of an X-ray wiggler beamline at DORIS III von Treusch, R., Joksch, S., Materlik, G.

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X-ray diffraction studies of annealed Czochralski-grown silicon. I. Double-crystal diffractometry von Joksch, S., Zaumseil, P., Zulehner, W.

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Strand Breaks in Plasmid DNA, Natural and Brominated, by Low-energy X-rays von Menke, H., Köhnlein, W., Joksch, S., Halpern, A.

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Multilayer optics for intense synchrotron x‐ray beams: Recent results on their performance von Ziegler, E., Marot, G., Freund, A. K., Joksch, St, Kawata, H., Berman, L. E., Iarocci, M.

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Performance of very thin silicon single‐crystal foils under high x‐ray power density von Freund, A. K., Marot, G., Kawata, H., Joksch, St, Ziegler, E., Berman, L. E., Hastings, J. B.

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Performance of an x‐ray optical time delay line with synchrotron radiation von Joksch, Stefan, Graeff, Walter, Hastings, Jerome B., Siddons, D. Peter

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Performance of beryllium crystals exposed to high x‐ray power density von Freund, A. K., Joksch, St, Kawata, H., Marot, G., Ziegler, E., Berman, L. E., Hastings, J. B.

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X-ray diffracton studies of annealed Czochralski-grown silicon. II. Triple-crystal diffractometry von Zaumseil, P., Joksch, S., Zulehner, W.

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Liquid nitrogen cooling of monochromator crystals exposed to intense synchrotron radiation von Joksch, Stefan, Marot, Gerard, Freund, Andreas, Krisch, Michael

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X-ray diffraction studies of annealed Czochralski-grown silicon. II: Triple-crystal diffractometry von ZAUMSEIL, P, JOKSCH, S, ZULEHNER, W

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Surface temperature and slope errors on plane mirrors exposed to high power synchrotron radiation von Jark, Werner, Mourikis, Spiridon, Joksch, Stefan, Saile, Volker

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Heating effects of monochromator crystals at a high-intensity wiggler beam line von Joksch, Stefan, Degenhardt, Detlev, Frahm, Ronald, Meyer, Gert, Jark, Werner

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Performance of Multilayers in Intense Synchrotron X-Ray Beams von Ziegler, E, Lepetre, Y, Joksch, S

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X‐ray reflection properties of annealed silicon single crystals von Zaumseil, P., Winter, U., Joksch, St, Freund, A. K.

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Characterization of thin, doped silicon single crystals by x-ray diffraction von JOKSCH, S, GRAEFF, W, ZAUMSEIL, P, WINTER, U, CSEPREGI, L, IBERL, F, FREUND, A. K

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Performance of Beryllium Crystals Exposed to High X-Ray Power Density von Freund, A K, Joksch, S T, Kawata, H, Marot, G, Ziegler, E, Berman, L E, Hastings, J B

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Multilayer Optics for Intense Synchrotron X-Ray Beams: Recent Results on Their Performance von Ziegler, E, Marot, G, Freund, A K, Joksch, S T, Kawata, H, Berman, L E, Iarocci, M

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