Low Dose Rate Effects in Shallow Trench Isolation Regions von Johnston, A H, Swimm, R T, Miyahira, T F

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Charge Yield at Low Electric Fields: Considerations for Bipolar Integrated Circuits von Johnston, A. H., Swimm, R. T., Thorbourn, D. O.

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Total Dose Effects on Bipolar Integrated Circuits at Low Temperature von Johnston, A. H., Swimm, R. T., Thorbourn, D. O.

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Activation of TrkB receptors by NGFβ mimetic peptide conjugated polymersome nanoparticles von Soumen, Roy, Dr.rer.nat, Johnston, A.H., PhD, Moin, Syed Tarique, MSc, Dudas, Jozsef, PhD, Newman, T.A., PhD, Hausott, Barbara, PhD, Schrott-Fischer, Anneliese, PhD, Glueckert, Rudolf, PhD

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Optocouplers: Fundamentals and Hardness Assurance for Space Applications von Johnston, A.H., Harris, R.D., Miyahira, T.F.

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Radiation effects in advanced microelectronics technologies von Johnston, A.H.

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LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance von Johnston, A.H., Miyahira, T.F.

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Radiation effects in micro-electromechanical systems (MEMS): RF relays von McClure, S.S., Edmonds, L.D., Mihailovich, R., Johnston, A.H., Alonzo, P., DeNatale, J., Lehman, J., Yui, C.

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Proton damage in advanced laser diodes von Johnston, A.H., Miyahira, T.F., Rax, B.G.

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Field Dependence of Charge Yield in Silicon Dioxide von Johnston, A. H., Swimm, R. T., Thorbourn, D. O., Adell, P. C., Rax, B. G.

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Charge generation and collection in p-n junctions excited with pulsed infrared lasers von Johnston, A.H.

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Single-Event Transients in Voltage Regulators von Johnston, A.H., Miyahira, T.F., Irom, F., Laird, J.S.

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Single-event upset in commercial silicon-on-insulator PowerPC microprocessors von Irom, F., Farmanesh, F.F., Johnston, A.H., Swift, G.M., Millward, D.G.

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Polymersomes, smaller than you think: ferrocene as a TEM probe to determine core structure von Johnston, A. H., Dalton, P. D., Newman, T. A.

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Characterization of proton damage in light-emitting diodes von Johnston, A.H., Miyahira, T.F.

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Single-event upset in flash memories von Schwartz, H.R., Nichols, D.K., Johnston, A.H.

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Trends in optocoupler radiation degradation von Miyahira, T.F., Johnston, A.H.

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A model for single-event transients in comparators von Johnston, A.H., Swift, G.M., Miyahira, T.F., Edmonds, L.D.

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Total dose effects in conventional bipolar transistors and linear integrated circuits von Johnston, A.H., Swift, G.M., Rax, B.G.

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Enhanced damage in linear bipolar integrated circuits at low dose rate von Johnston, A.H., Rax, B.G., Lee, C.I.

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