Protein palmitoylation and cancer von Ko, Pin‐Joe, Dixon, Scott J

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Exogenous Monounsaturated Fatty Acids Promote a Ferroptosis-Resistant Cell State von Magtanong, Leslie, Ko, Pin-Joe, To, Milton, Cao, Jennifer Y., Forcina, Giovanni C., Tarangelo, Amy, Ward, Carl C., Cho, Kevin Y., Patti, Gary J., Nomura, Daniel K., Olzmann, James A., Dixon, Scott J.

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A ZDHHC5-GOLGA7 Protein Acyltransferase Complex Promotes Nonapoptotic Cell Death von Ko, Pin-Joe, Woodrow, Claire, Dubreuil, Michael M., Martin, Brent R., Skouta, Rachid, Bassik, Michael C., Dixon, Scott J.

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Transient knockdown and overexpression reveal a developmental role for the zebrafish enosf1b gene von Finckbeiner, Steve, Ko, Pin-Joe, Carrington, Blake, Sood, Raman, Gross, Kenneth, Dolnick, Bruce, Sufrin, Janice, Liu, Paul

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Exogenous Monounsaturated Fatty Acids Promote a Ferroptosis-Resistant Cell State von Magtanong, Leslie, Ko, Pin-Joe, To, Milton, Cao, Jennifer Yinuo, Forcina, Giovanni C., Tarangelo, Amy, Ward, Carl C., Cho, Kevin, Patti, Gary J., Nomura, Daniel K., Olzmann, James A., Dixon, Scott J.

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Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for p-Channel Metal–Oxide–Semiconductor Field-Effect Transistors of 0.13 µm Technology von Chen, Shuang-Yuan, Tu, Chia-Hao, Lin, Jung-Chun, Wang, Mu-Chun, Kao, Po-Wei, Lin, Memg-Hong, Wu, Ssu-Han, Jhou, Ze-Wei, Chou, Sam, Ko, Joe, Haung, Heng-Sheng

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Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications von Chen, Shuang-Yuan, Lin, Jung-Chun, Chen, Hung-Wen, Lin, Hung-Chuan, Jhou, Ze-Wei, Chou, Sam, Ko, Joe, Lei, Tien-Fu, Haung, Heng-Sheng

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Investigation of DC Hot-Carrier Degradation at Elevated Temperatures for n-Channel Metal–Oxide–Semiconductor Field-Effect-Transistor of 0.13 µm Technology von Lin, Jung-Chun, Chen, Shuang-Yuan, Chen, Hung-Wen, Jhou, Ze-Wei, Lin, Hung-Chuan, Chou, Sam, Ko, Joe, Lei, Tien-Fu, Haung, Heng-Sheng

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Temperature Effects on the Hot-Carrier Induced Degradation of pMOSFETs von Shuang-Yuan Chen, Chia-Hao Tu, Jung-Chun Lin, Po-Wei Kao, Wen-Cheng Lin, Ze-Wei Jhou, Sam Chou, Joe Ko, Heng-Sheng Haung

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The switch of the worst case on NBTI and hot-carrier reliability for 0.13 μm pMOSFETs von Tu, Chia-Hao, Chen, Shuang-Yuan, Lin, Meng-Hong, Wang, Mu-Chun, Wu, Ssu-Han, chou, Sam, Ko, Joe, Huang, Heng-Sheng

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The switch of the worst case on NBTI and hot-carrier reliability for 0.13 mum pMOSFETs von Tu, Chia-Hao, Chen, Shuang-Yuan, Lin, Meng-Hong, Wang, Mu-Chun, Wu, Ssu-Han, Chou, Sam, Ko, Joe, Huang, Heng-Sheng

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A new on-chip ESD protection circuit with dual parasitic SCR structures for CMOS VLSI von WU, C H U N G-Y U, KER, M I N G-D O U, LEE, C H U N G-Y U A N, Ko, J O E

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Gate-assisted high-Q-factor junction varactor von Gau, J.-H., Wu, R.-T., Sang, S., Kuo, C.-H., Chang, T.-L., Chen, H.-H., Chen, A., Ko, J.

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Zebrafish as a vertebrate model of ENOSF1 function von Finckbeiner, Steven Michael, Ko, Pin‐Joe, Bishop, Kevin, Sood, Raman, Gross, Kenneth, Dolnick, Bruce, Sufrin, Janice, Liu, Paul

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A new drain engineering structure-SCD-LDD (surface counter doped LDD) for improved hot carrier reliability von JIH WEN CHOU, CHUN YUN CHANG, LIEN TSE HO, JOE KO, HSUE, P

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Charge loss due to AC program disturbance stresses in EPROMs von Lin, Jyh-Kuang, Chang, Chun-Yen, Wang, Tai-Ho, Huang, Heng-Sheng, Chen, Kun-Luh, Ho, Tai-Shung, Ko, Joe

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Novel fully symmetrical inductor von Gau, J.-H., Sang, S., Wu, R.-T., Shen, F.-J., Chen, H.-H., Chen, A., Ko, J.

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Effect of Etch Stop Layer Stress on Negative Bias Temperature Instability of Deep Submicron p-Type Metal–Oxide–Semiconductor Field Effect Transistors with Dual Gate Oxide von Chen, Ming-Shing, Fang, Yean-Kuen, Lee, Tung-Hsing, Lin, Chien-Ting, Chiang, Yen-Ting, Ko, Joe, Sheu, Yau Kae, Shen, Tsong Lin, Liao, Wen Yi

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Optimized ONO thickness for multi-level and 2-bit/cell operation for wrapped-select-gate (WSG) SONOS memory von Wu, Woei-Cherng, Chao, Tien-Sheng, Peng, Wu-Chin, Yang, Wen-Luh, Chen, Jian-Hao, Ma, Ming Wen, Lai, Chao-Sung, Yang, Tsung-Yu, Lee, Chien-Hsing, Hsieh, Tsung-Min, Liou, Jhyy Cheng, Chen, Tzu Ping, Chen, Chien Hung, Lin, Chih Hung, Chen, Hwi Huang, Ko, Joe

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New Large Angle Tilt Implanted Drain Structure: Surface Counter-Doped-Lightly Doped Drain for High Hot Carrier Reliability von Chou, Jih Wen, Chang, Chun Yun, Huang, Chimoon, Ho, Lien Tse, Ko, Joe, Hsue, Peter

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