Direct Current (DC) Bias Stress Characteristics of a Bottom-Gate Thin-Film Transistor with an Amorphous/Microcrystalline Si Double Layer von Jeong, Tae-Hoon, Kim, Si-Joon, Kim, Hyun-Jae

Volltext

Crystallization of amorphous Si thin films by the reaction of MoO3/Al nanoengineered thermite von Bae, Jung Hyeon, Kim, Do Kyung, Jeong, Tae Hoon, Kim, Hyun Jae

Volltext

Study on the Effects of Zr-Incorporated InZnO Thin-Film Transistors Using a Solution Process von Jeong, Tae Hoon, Kim, Si Joon, Yoon, Doo Hyun, Jeong, Woong Hee, Kim, Dong Lim, Lim, Hyun Soo, Kim, Hyun Jae

Volltext

Tantalum capping on platinum thin heater for selective area heating von Jeong, Woong Hee, Kim, Do Kyung, Lee, Choong Hee, Jeong, Tae Hoon, Hwang, Tae Hyung, Kim, Hyun Jae

Volltext

Crystallization of amorphous silicon thin films using nanoenergetic intermolecular materials with buffer layers von Lee, Choong Hee, Jeong, Tae Hoon, Kim, Do Kyung, Jeong, Woong Hee, Kang, Myung-Koo, Hwang, Tae Hyung, Kim, Hyun Jae

Volltext

Electrochemical Properties of (Li0.5-xNaxLa0.5)Ti0.8Zr0.2O3 Ceramics as Improved Electrolyte Materials for Li-ion Batteries von 이승환, 김홍기, 연세솔, 정태훈, 남성필, 김영성, 김재철, 이규택, 임인호

Volltext

Study on the Effects of Zr-Incorporated InZnO Thin-Film Transistors Using a Solution Process von Jeong, Tae Hoon, Kim, Si Joon, Yoon, Doo Hyun, Jeong, Woong Hee, Kim, Dong Lim, Lim, Hyun Soo, Kim, Hyun Jae

Volltext

The Electrical Properties of Low Temperature Polycrystalline Si Thin Film Transistor Prepared by Nickel-ALD Process von Lee, Seung Min, Lee, Choong Hee, Jeong, Tae Hoon, Kim, Hyun Jae

Volltext

Direct Current (DC) Bias Stress Characteristics of a Bottom-Gate Thin-Film Transistor with an Amorphous/Microcrystalline Si Double Layer von Jeong, Tae-Hoon, Kim, Si-Joon, Kim, Hyun-Jae

Volltext

Crystallization of amorphous Si thin films by the reaction of MoO 3/Al nanoengineered thermite von Bae, Jung Hyeon, Kim, Do Kyung, Jeong, Tae Hoon, Kim, Hyun Jae

Volltext

The Electrical Characterization and Relaxation Behavior of Ag(Ta 0.8 Nb 0.2 )O 3 Ceramics von Kim, Young-Sung, Kim, Jae-Chul, Jeong, Tae-Hoon, Nam, Sung-Pill, Lee, Seung-Hwan, Kim, Hong-Ki, Lee, Ku-Tak

Volltext

The Electrical Characterization and Relaxation Behavior of Ag(Ta0.8Nb0.2)O3 Ceramics von 김영성, 김재철, 정태훈, 남성필, 이승환, 김홍기, 이규택

Volltext

Electrochemical Properties of (Li 0.5-x Na x La 0.5 )Ti 0.8 Zr 0.2 O 3 Ceramics as Improved Electrolyte Materials for Li-ion Batteries von Lee, Seung-Hwan, Kim, Hong-Ki, Yun, Ye-Sol, Jeong, Tae-Hoon, Nam, Sung-Pill, Kim, Young-Sung, Kim, Jae-Chul, Lee, Ku-Tak, Im, In-Ho

Volltext

Stability of Solution-processed ZrInZnO Thin-film Transistors under Gate Bias Stress von Jeong, Tae Hoon, Kim, Si Joon, Yoon, Doo Hyun, Jeong, Woong Hee, Kim, Dong Lim, Lim, Hyun Soo, Kim, Hyun Jae

Volltext

Mobile inspection device on vehicle von JEONG, TAE HOON

Volltext bestellen

(Invited) Optoelectronic Application of Colloidal Quatum Dots in Infrared Beyond Si von Hwang, Gyu Weon, Jin, Jun Young, Park, Taehwan, Jeong, Tae Hoon

Volltext

Electrochemical Properties of (Li 0.5-x Na x La 0.5 )Ti 0.8 Zr 0.2 O 3 Ceramics as Improved Electrolyte Materials for Li-ion Batteries von Lee, Seung-Hwan, Kim, Hong-Ki, Yun, Ye-Sol, Jeong, Tae-Hoon, Nam, Sung-Pill, Kim, Young-Sung, Kim, Jae-Chul, Lee, Ku-Tak, Im, In-Ho

Volltext

The Electrical Characterization and Relaxation Behavior of Ag(Ta 0.8 Nb 0.2 )O 3 Ceramics von Kim, Young-Sung, Kim, Jae-Chul, Jeong, Tae-Hoon, Nam, Sung-Pill, Lee, Seung-Hwan, Kim, Hong-Ki, Lee, Ku-Tak

Volltext

Electrical analysis of bottom gate TFT with novel process architecture von Pak, Sang Hoon, Jeong, Tae Hoon, Kim, Si Joon, Kim, Kyung Ho, Kim, Hyun Jae

Volltext

Characteristics of Atmospheric Circulation Associated with Cold Surge Occurrences in East Asia： A Case Study During 2005/06 Winter von Park, Tae-Won, Jeong, Jee-Hoon, Ho, Chang-Hoi, Kim, Seong-Joong

Volltext