Ultra-Small-Angle X-ray Scattering Instrument at the Advanced Photon Source: History, Recent Development, and Current Status von Ilavsky, J., Zhang, F., Allen, A. J., Levine, L. E., Jemian, P. R., Long, G. G.

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Irena: tool suite for modeling and analysis of small-angle scattering von Ilavsky, Jan, Jemian, Peter R.

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Real-time compression of streaming X-ray photon correlation spectroscopy area-detector data von Madden, T., Jemian, P., Narayanan, S., Sandy, A.R., Sikorski, M., Sprung, M., Weizeorick, J.

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Glassy Carbon as an Absolute Intensity Calibration Standard for Small-Angle Scattering von Zhang, Fan, Ilavsky, Jan, Long, Gabrielle G., Quintana, John P. G., Allen, Andrew J., Jemian, Pete R.

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Ultra-small-angle X-ray scattering at the Advanced Photon Source von Ilavsky, Jan, Jemian, Pete R., Allen, Andrew J., Zhang, Fan, Levine, Lyle E., Long, Gabrielle G.

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Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures von Ilavsky, J., Allen, A. J., Long, G. G., Jemian, P. R.

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Firmware lower-level discrimination and compression applied to streaming x-ray photon correlation spectroscopy area-detector data von Madden, T., Fernandez, P., Jemian, P., Narayanan, S., Sandy, A. R., Sikorski, M., Sprung, M., Weizeorick, J.

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Determination of Phonon Dispersions from X-Ray Transmission Scattering: The Example of Silicon von Holt, M., Wu, Z., Hong, Hawoong, Zschack, P., Jemian, P., Tischler, J., Chen, Haydn, Chiang, T.-C.

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Quantitative characterization of the contrast mechanisms of ultra-small-angle X-ray scattering imaging von Zhang, F., Long, G. G., Levine, L. E., Ilavsky, J., Jemian, P. R.

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Versatile Collimating Crystal Stage for a Bonse-Hart USAXS Instrument von Ilavsky, J, Shu, D, Jemian, P R, Long, G G

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Kinetic transition in the growth of Al nanocrystals in Al-Sm alloys von Imhoff, S. D., Ilavsky, J., Zhang, F., Jemian, P., Evans, P. G., Perepezko, J. H.

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High-resolution small-angle X-ray scattering camera for anomalous scattering von Long, G. G., Jemian, P. R., Weertman, J. R., Black, D. R., Burdette, H. E., Spal, R.

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Quantitative Measurement of Nanoparticle Halo Formation around Colloidal Microspheres in Binary Mixtures von Zhang, Fan, Long, Gabrielle G, Jemian, Pete R, Ilavsky, Jan, Milam, Valeria T, Lewis, Jennifer A

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Non-cavitation tensile creep in Lu-doped silicon nitride von Lofaj, Frantisek, Wiederhorn, Sheldon M., Long, Gabrielle G., Hockey, Bernard J., Jemian, Pete R., Browder, Lisa, Andreason, Jonathan, Täffner, Ulrike

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Pattern of x-ray scattering by thermal phonons in Si von Wu, Z., Hong, Hawoong, Aburano, R., Zschack, P., Jemian, P., Tischler, J., Chen, Haydn, Luh, D.-A., Chiang, T.-C.

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Relation of the fractal structure of organic pigments to their performance von Skillas, G., Agashe, N., Kohls, D. J., Ilavsky, J., Jemian, P., Clapp, L., Schwartz, R. J., Beaucage, G.

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Reflection surface x-ray diffraction patterns: k-space images von Hong, Hawoong, Wu, Z., Chiang, T.-C., Zschack, P., Jemian, P., Chen, Haydn, Aburano, R. D.

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Silicon photodiode detector for small-angle X-ray scattering von Jemian, P. R., Long, G. G.

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Synchrotron-based imaging and tomography with hard X-rays von Rau, C., Crecea, V., Liu, W., Richter, C.-P., Peterson, K.M., Jemian, P.R., Neuhäusler, U., Schneider, G., Yu, X., Braun, P.V., Chiang, T.-C., Robinson, I.K.

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Evolution of the Pore Size Distribution in Final-Stage Sintering of Alumina Measured by Small-Angle X-ray Scattering von Krueger, Susan, Long, Gabrielle G., Black, David R., Minor, Dennis, Jemian, Pete R., Nieman, G. William, Page, Richard A.

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