Spectroscopic ellipsometry data analysis: measured versus calculated quantities von Jellison, Jr, G.E.

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Data analysis for spectroscopic ellipsometry von Jellison, G.E.

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Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry von Jellison, G.E., Merkulov, V.I., Puretzky, A.A., Geohegan, D.B., Eres, G., Lowndes, D.H., Caughman, J.B.

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Optical functions of silicon determined by two-channel polarization modulation ellipsometry von Jellison, G.E.

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Increase in pyrolytic carbon optical anisotropy and density during processing of coated particle fuel due to heat treatment von Hunn, J.D., Jellison, G.E., Lowden, R.A.

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The calculation of thin film parameters from spectroscopic ellipsometry data von Jellison, G.E.

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Epitaxial growth of anatase by reactive sputter deposition using water vapor as the oxidant von Jeong, B.-S., Norton, D.P., Budai, J.D., Jellison, G.E.

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Optical functions of GaAs, GaP, and Ge determined by two-channel polarization modulation ellipsometry von Jellison, G.E.

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Exploratory Research on the Development of Novel ^-Activated Phosphate Glass Scintillators von Wisniewski, D., Boatner, L.A., Ramey, J.O., Wisniewska, M., Neal, J.S., Jellison, G.E.

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Improved Lithium Iodide neutron scintillator with Eu2+ activation II: Activator zoning and concentration effects in Bridgman-grown crystals von Boatner, L.A., Comer, E.P., Wright, G.W., Ramey, J.O., Riedel, R.A., Jellison, G.E., Kolopus, J.A.

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Parameterization of the optical functions of amorphous materials in the interband region von Jellison, G. E., Modine, F. A.

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Optical properties of a nanostructured glass-based film using spectroscopic ellipsometry von Jellison, G.E., Aytug, T., Lupini, A.R., Paranthaman, M.P., Joshi, P.C.

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Improved lithium iodide neutron scintillator with Eu2+ activation: The elimination of Suzuki-Phase precipitates von Boatner, L.A., Comer, E.P., Wright, G.W., Ramey, J.O., Riedel, R.A., Jellison, G.E., Kolopus, J.A.

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Improved Lithium Iodide neutron scintillator with Eu 2 + activation II: Activator zoning and concentration effects in Bridgman-grown crystals von Boatner, L.A., Comer, E.P., Wright, G.W., Ramey, J.O., Riedel, R.A., Jellison, G.E., Kolopus, J.A.

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Spectroscopic ellipsometry characterization of thin-film silicon nitride von Jellison, Jr, G.E., Modine, F.A., Doshi, P., Rohatgi, A.

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Application specific spectral response with CMOS compatible photodiodes von Simpson, M.L., Ericson, M.N., Jellison, G.E., Dress, W.B., Wintenberg, A.L., Bobrek, M.

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A stable thin-film lithium electrolyte : Lithium phosphorus oxynitride von YU, X, BATES, J. B, JELLISON, G. E, HART, F. X

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Comparative diagnostics of ArF- and KrF-laser generated carbon plumes used for amorphous diamond-like carbon film deposition von Puretzky, A.A., Geohegan, D.B., Jellison, G.E., McGibbon, M.M.

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Electric Field-Induced Birefringence in LiNbO3Measured by Generalized Transmission Ellipsometry von Jellison, G.E.

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Growth, Characterization, and Electrochemical Properties of Doped n-type KTaO3 Photoanodes von Paulauskas, Irene E, Katz, J. E., Lewis, N., Boatner, Lynn A, Brown, G. M.

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