Spectroscopic ellipsometry data analysis: measured versus calculated quantities von Jellison, Jr, G.E.

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A stable thin-film lithium electrolyte : Lithium phosphorus oxynitride von YU, X, BATES, J. B, JELLISON, G. E, HART, F. X

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Parameterization of the optical functions of amorphous materials in the interband region von Jellison, G. E., Modine, F. A.

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Pseudodielectric functions of uniaxial materials in certain symmetry directions von JELLISON, G. E, BABA, J. S

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Spectroscopic ellipsometry of thin film and bulk anatase (TiO2) von Jellison, G. E., Boatner, L. A., Budai, J. D., Jeong, B.-S., Norton, D. P.

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Data analysis for spectroscopic ellipsometry von Jellison, G.E.

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Two-modulator generalized ellipsometry: theory von Jellison, G E, Modine, F A

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Two-modulator generalized ellipsometry: experiment and calibration von Jellison, G E, Modine, F A

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Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry von Jellison, G. E., Leonard, D. N., Anovitz, L. M., Parish, C. M., Specht, E. D., Rosseel, T. M.

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Optical functions of uniaxial rutile and anatase (TiO2) revisited von Jellison, G. E., Cureton, W. F., Arteaga, O.

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Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry von Jellison, G. E., Leonard, D. N., Anovitz, L. M., Cheshire, M. C., Specht, E. D., Rosseel, T. M.

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Characterization of thin-film amorphous semiconductors using spectroscopic ellipsometry von Jellison, G.E., Merkulov, V.I., Puretzky, A.A., Geohegan, D.B., Eres, G., Lowndes, D.H., Caughman, J.B.

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Optical characterization of tristructural isotropic fuel particle cross-sections using generalized ellipsometry von Jellison, G.E., Hunn, J.D., Lowden, R.A.

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Increase in pyrolytic carbon optical anisotropy and density during processing of coated particle fuel due to heat treatment von Hunn, J.D., Jellison, G.E., Lowden, R.A.

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Optical anisotropy measurements of TRISO nuclear fuel particle cross-sections: The method von Jellison, G.E., Hunn, J.D.

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Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2)) von Jellison, Jr, G E, Modine, F A, Boatner, L A

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Generalized ellipsometry for materials characterization von Jellison, G.E.

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Optical functions of chemical vapor deposited thin-film silicon determined by spectroscopic ellipsometry von JELLISON, G. E, CHISHOLM, M. F, GORBATKIN, S. M

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Optical and Electrical Properties of Sn-Doped Zinc Oxide Single Crystals von Haseman, M. S., Saadatkia, Pooneh, Warfield, J. T., Lawrence, J., Hernandez, A., Jellison, G. E., Boatner, L. A., Selim, F. A.

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Epitaxial growth of anatase by reactive sputter deposition using water vapor as the oxidant von Jeong, B.-S., Norton, D.P., Budai, J.D., Jellison, G.E.

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