Humidity build-up in electronic enclosures exposed to different geographical locations by RC modelling and reliability prediction von Conseil-Gudla, H., Staliulionis, Z., Mohanty, S., Jellesen, M.S., Hattel, J.H., Ambat, R.

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Nickel-containing coins: a health risk for nickel-sensitive individuals? von Jellesen, M.S., Hilbert, L.R., Menné, T., Møller, P.

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Nickel-containing coins: a health risk for nickel-sensitive individuals?: Correspondence von Jellesen, M.S., Hilbert, L.R., Menné, T., Møller, P.

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Effect of solder flux residues on corrosion of electronics von Hansen, K.S., Jellesen, M.S., Moller, P., Westermann, P.J.S., Ambat, R.

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A block-on-ring tribocorrosion setup for combined electrochemical and friction testing von Jellesen, M.S., Hansen, M.Ø., Hilbert, L.R., Møller, P.

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Electrochemical Migration on Electronic Chip Resistors in Chloride Environments von Minzari, D., Jellesen, M.S., Moller, P., Wahlberg, P., Ambat, R.

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