A 64-point Fourier transform chip for high-speed wireless LAN application using OFDM von Maharatna, K., Grass, E., Jagdhold, U.

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Low-Power VLSI Implementation of the Inner Receiver for OFDM-Based WLAN Systems von Troya, A., Maharatna, K., Krstic, M., Grass, E., Jagdhold, U., Kraemer, R.

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Efficient Inner Receiver Design for OFDM-Based WLAN Systems: Algorithm and Architecture von Troya, A., Maharatna, K., Krstic, M., Grass, E., Jagdhold, U., Kraemer, R.

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Differential ECL/CML Synthesis for SiGe BiCMOS von Gustat, H., Jagdhold, U., Winkler, F., Appel, M., Kell, G.

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An integrated 8-12 GHz fractional-N frequency synthesizer in SiGe BiCMOS for satellite communications von Herzel, Frank, Osmany, Sabbir A., Hu, Kai, Schmalz, Klaus, Jagdhold, Ulrich, Scheytt, J. Christoph, Schrape, Oliver, Winkler, Wolfgang, Follmann, Rüdiger, Köther, Dietmar, Kohl, Thorsten, Kersten, Olaf, Podrebersek, Thomas, Heyer, Heinz-Volker, Winkler, Frank

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On the single-chip implementation of a Hiperlan/2 and IEEE 802.11a capable modem von Grass, E., Tittelbach-Helmrich, K., Jagdhold, U., Troya, A., Lippert, G., Kruger, O., Lehmann, J., Maharatna, K., Dombrowski, K.F., Fiebig, N., Kraemer, R., Mahonen, P.

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An All-Digital Phase-Locked Loop with High Resolution for Local On-Chip Clock Synthesis von Schrape, Oliver, Winkler, Frank, Zeidler, Steffen, Petri, Markus, Grass, Eckhard, Jagdhold, Ulrich

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A novel 64-point FF/IFFT processor for IEEE 802.11(a) standard von Maharatna, K., Grass, E., Jagdhold, U.

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A single SiGe chip fractional-N 275 MHz - 20 GHz PLL with integrated 20 GHz VCO von Follmann, R., Kother, D., Kohl, T., Engels, M., Podrebersek, T., Heyer, V., Schmalz, K., Herzel, F., Winkler, W., Osmany, S., Jagdhold, U.

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Electron beam lithography over topography von Bauch, L., Jagdhold, U., Böttcher, M.

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Base band processor for IEEE 802.11a standard with embedded BIST von Krstic, Milos, Maharatna, Koushik, Troya, Alfonso, Grass, Eckhard, Jagdhold, Ulrich

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Antimony implantation into Si-B doping superlattices—damage and enhanced diffusion von Krüger, D., Jagdhold, U., Kurps, R., Zeindl, H. P.

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Passivation effects in novolak based resists during O2-RIE von Jagdhold, U., Pelka, J.

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Passivation effects in novolak based resists during O 2-RIE von Jagdhold, U., Pelka, J.

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X-ray in situ observation of relaxation and diffusion processes in Si1− x Ge x layers on silicon substrates von Zaumseil, P., Jagdhold, U., Krüger, D.

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Influence of interdiffusion and surfactants on Si/SiGe heterointerfaces von Zeindl, H.P., Nilsson, S., Jagdhold, U., Klatt, J., Kurps, R., Krüger, D., Bugiel, E.

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Strain measurement in thin pseudomorphic SiGe layers of submicron wires using Raman spectroscopy von Dietrich, B., Bugiel, E., Frankenfeldt, H., Harker, A.H., Jagdhold, U., Tillack, B., Wolff, A.

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Resist process to join electron beam lithography and photolithography von Bauch, L., Bo¨ttcher, M., Jagdhold, U.

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Dry etching pattern transfer of 0.3 μm structures in technological layers using transmission phase masks von Bauch, L., Wolff, A., Jagdhold, U., Skaloud, T., Bauer, J.

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Point Defect Concentrations, Distributions and Diffusivity in Thin Si MBE-Films: Experiments and Simulations Based on Profiling of Implanted Multiple Delta Doping Structures von Jagdhold, U., Kurps, R., Krüger, D., Zeindl, H.P.

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