A 12-Bit Vernier Ring Time-to-Digital Converter in 0.13 μm CMOS Technology von JIANJUN YU, DAI, Fa Foster, JAEGER, Richard C

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First-Order Piezoresistive Coefficients of Lateral NMOS FETs on 4H Silicon Carbide von Jaeger, Richard C., Chen, Jun, Suhling, Jeffrey C., Fursin, Leonid

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First- and Second-Order Piezoresistive Coefficients of CMOS FETs From Strong Into Weak Inversion von Jaeger, Richard C., Suhling, Jeffrey C.

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New Perspectives for Whole Genome Amplification in Forensic STR Analysis von Jäger, Richard

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CMOS Sensor Arrays for High Resolution Die Stress Mapping in Packaged Integrated Circuits von Yonggang Chen, Jaeger, R. C., Suhling, J. C.

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Diagonal Mode van der Pauw Stress Sensors: Proof of Diagonal-Mode Conjecture von Jaeger, Richard C, Suhling, Jeffrey C, Chen, Jun

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Special Issue on Whole Genome Amplification von Jäger, Richard

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Silicon piezoresistive stress sensors and their application in electronic packaging von Suhling, J.C., Jaeger, R.C.

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Erratum: “Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors” [ASME J. Electron. Packag., 2014, 136(4), p. 041014; DOI: 10.1115/1.4028333] von Jaeger, Richard C, Motalab, Mohammad, Hussain, Safina, Suhling, Jeffrey C

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An 11-Bit 8.6 GHz Direct Digital Synthesizer MMIC With 10-Bit Segmented Sine-Weighted DAC von Xueyang Geng, Dai, F.F., Irwin, J.D., Jaeger, R.C.

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Four-Wire Bridge Measurements of Silicon van der Pauw Stress Sensors von Jaeger, Richard C, Motalab, Mohammad, Hussain, Safina, Suhling, Jeffrey C

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24-Bit 5.0 GHz Direct Digital Synthesizer RFIC With Direct Digital Modulations in 0.13 \mu m SiGe BiCMOS Technology von Xueyang Geng, Dai, Fa Foster, Irwin, J David, Jaeger, Richard C

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Effect of nucleation site spacing on the pool boiling characteristics of a structured surface von Nimkar, Nitesh D., Bhavnani, Sushil H., Jaeger, Richard C.

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An X- and Ku-Band Wideband Recursive Receiver MMIC With Gain-Reuse von Desheng Ma, Dai, Fa Foster, Jaeger, Richard C, Irwin, J David

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A 12 GHz 1.9 W Direct Digital Synthesizer MMIC Implemented in 0.18 μm SiGe BiCMOS Technology von XUEFENG YU, DAI, Fa Foster, IRWIN, J. David, JAEGER, Richard C

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Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From 150\,^C to 125\,^C von Chun-Hyung Cho, Jaeger, R.C., Suhling, J.C.

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CMOS stress sensors on [100] silicon von Jaeger, R.C., Suhling, J.C., Ramani, R., Bradley, A.T., Jianping Xu

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Genomic Multicopy Loci Targeted by Current Forensic Quantitative PCR Assays von Jager, Richard

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A 1D numerical model for rapid stress analysis in bipolar junction transistors von Gnanachchelvi, Parameshwaran, Wilamowski, Bogdan M., Jaeger, Richard C., Hussain, Safina, Suhling, Jeffrey C., Hamilton, Michael C.

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An X-Band Radar Transceiver MMIC with Bandwidth Reduction in 0.13 µm SiGe Technology von Jianjun Yu, Feng Zhao, Cali, Joseph, Dai, Fa Foster, Desheng Ma, Xueyang Geng, Yuehai Jin, Yuan Yao, Xin Jin, Irwin, J. David, Jaeger, Richard C.

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