Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales von Gujrati, Abhijeet, Khanal, Subarna R, Pastewka, Lars, Jacobs, Tevis D. B

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Surface topography as a material parameter von Jacobs, Tevis D. B., Pastewka, Lars

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Nanoscale wear as a stress-assisted chemical reaction von Jacobs, Tevis D. B., Carpick, Robert W.

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Linking energy loss in soft adhesion to surface roughness von Dalvi, Siddhesh, Gujrati, Abhijeet, Khanal, Subarna R., Pastewka, Lars, Dhinojwala, Ali, Jacobs, Tevis D. B.

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Quantitative characterization of surface topography using spectral analysis von Jacobs, Tevis D B, Junge, Till, Pastewka, Lars

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Measuring and Understanding Contact Area at the Nanoscale: A Review von Jacobs, Tevis D. B, Martini, Ashlie

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Sub-10 Nanometer Feature Size in Silicon Using Thermal Scanning Probe Lithography von Ryu Cho, Yu Kyoung, Rawlings, Colin D, Wolf, Heiko, Spieser, Martin, Bisig, Samuel, Reidt, Steffen, Sousa, Marilyne, Khanal, Subarna R, Jacobs, Tevis D. B, Knoll, Armin W

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Dependence of adhesive friction on surface roughness and elastic modulus von Maksuta, Daniel, Dalvi, Siddhesh, Gujrati, Abhijeet, Pastewka, Lars, Jacobs, Tevis D. B, Dhinojwala, Ali

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Atomistic Simulations of the Elastic Compression of Platinum Nanoparticles von Padilla Espinosa, Ingrid M., Jacobs, Tevis D. B., Martini, Ashlie

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Evaluation of Force Fields for Molecular Dynamics Simulations of Platinum in Bulk and Nanoparticle Forms von Padilla Espinosa, Ingrid M, Jacobs, Tevis D. B, Martini, Ashlie

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Single sheets of graphene for fabrication of fibers with enhanced mechanical properties von Salim, Muhammad G, Thimons, Luke A, Kim, Min A, Carr, Brennan, Montgomery, Michelle, Tolman, Nathan, Jacobs, Tevis, Liu, Haitao

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The Effect of Atomic-Scale Roughness on the Adhesion of Nanoscale Asperities: A Combined Simulation and Experimental Investigation von Jacobs, Tevis D. B., Ryan, Kathleen E., Keating, Pamela L., Grierson, David S., Lefever, Joel A., Turner, Kevin T., Harrison, Judith A., Carpick, Robert W.

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Simulations of the effect of an oxide on contact area measurements from conductive atomic force microscopy von Chen, Rimei, Vishnubhotla, Sai Bharadwaj, Jacobs, Tevis D. B, Martini, Ashlie

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Characterizing nanoscale scanning probes using electron microscopy: A novel fixture and a practical guide von Jacobs, Tevis D. B., Wabiszewski, Graham E., Goodman, Alexander J., Carpick, Robert W.

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Tribochemical Wear of Diamond-Like Carbon-Coated Atomic Force Microscope Tips von Liu, Jingjing, Jiang, Yijie, Grierson, David S., Sridharan, Kumar, Shao, Yuchong, Jacobs, Tevis D. B., Falk, Michael L., Carpick, Robert W., Turner, Kevin T.

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Heterogeneity in the Small-Scale Deformation Behavior of Disordered Nanoparticle Packings von Lefever, Joel A, Jacobs, Tevis D. B, Tam, Qizhan, Hor, Jyo Lyn, Huang, Yun-Ru, Lee, Daeyeon, Carpick, Robert W

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Quantitative measurement of contact area and electron transport across platinum nanocontacts for scanning probe microscopy and electrical nanodevices von Vishnubhotla, Sai Bharadwaj, Chen, Rimei, Khanal, Subarna R, Li, Jing, Stach, Eric A, Martini, Ashlie, Jacobs, Tevis D B

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Simulated Adhesion between Realistic Hydrocarbon Materials: Effects of Composition, Roughness, and Contact Point von Ryan, Kathleen E, Keating, Pamela L, Jacobs, Tevis D. B, Grierson, David S, Turner, Kevin T, Carpick, Robert W, Harrison, Judith A

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Size-dependent shape distributions of platinum nanoparticles von Ding, Ruikang, Padilla Espinosa, Ingrid M, Loevlie, Dennis, Azadehranjbar, Soodabeh, Baker, Andrew J, Mpourmpakis, Giannis, Martini, Ashlie, Jacobs, Tevis D. B

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On the Application of Transition State Theory to Atomic-Scale Wear von Jacobs, Tevis D. B., Gotsmann, Bernd, Lantz, Mark A., Carpick, Robert W.

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