A new examination of secondary electron yield data von Lin, Yinghong, Joy, David C.

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SMART – a program to measure SEM resolution and imaging performance von Joy, D. C.

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Scanning electron microscope imaging in liquids – some data on electron interactions in water von JOY, D. C., JOY, C. S.

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Low voltage scanning electron microscopy von Joy, David C., Joy, Carolyn S.

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A database on electron-solid interactions von Joy, David C.

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Experimental secondary electron spectra under SEM conditions von JOY, D. C., PRASAD, M. S., MEYER, H. M.

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Nanoscale electron-beam-stimulated processing von Rack, P. D., Randolph, S., Deng, Y., Fowlkes, J., Choi, Y., Joy, D. C.

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Condensed phase growth of single-wall carbon nanotubes from laser annealed nanoparticulates von Geohegan, D. B., Schittenhelm, H., Fan, X., Pennycook, S. J., Puretzky, A. A., Guillorn, M. A., Blom, D. A., Joy, D. C.

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An experimental model of beam broadening in the variable pressure scanning electron microscope von Tang, Xiaohu, Joy, David C.

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The Aberration Corrected SEM von Joy, David C., Oak Ridge National Laboratory, Oak Ridge, TN 37831-6064

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Calculations of Mott scattering cross section von CZYZEWSKI, Z, O'NEILL MACCALLUM, D, ROMIG, A, JOY, D. C

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An empirical stopping power relationship for low-energy electrons von Joy, D. C., Luo, S.

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The efficiency of X‐ray production at low energies von Joy, D C

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Fouling mechanisms of membranes during protein ultrafiltration von Jim, K.J., Fane, A.G., Fell, C.J.D., Joy, D.C.

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Microcalorimeter Detectors and Low Voltage SEM Microanalysis von Kenik, Edward A., Joy, David C., Redfern, Del

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Experimental resolution measurement in critical dimension scanning electron microscope metrology von Lorusso, G. F., Joy, D. C.

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A novel technique for visualizing electron beam induced charging von Tang, Xiaohu, Joy, David C.

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Empirical forms for the electron/atom elastic scattering cross sections from 0.1 to 30 keV von Browning, R., Li, T. Z., Chui, B., Ye, Jun, Pease, R. F. W., Czyżewski, Z., Joy, D. C.

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Quantitative measurements of charging in a gaseous environment von Tang, Xiaohu, Joy, David C.

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Holographic voltage profiling on 75 nm gate architecture CMOS devices von Thesen, Alexander E., G. Frost, Bernhard, C. Joy, David

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