A time to failure evaluation of AlGaN/GaN HEMT transistors for RF applications von Latry, Olivier, Moultif, Niemat, Joubert, Eric, Ndiaye, Mohamed

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In-depth analysis of the static behaviour of a SiC MOSFET and of its associated parameters using both compact modelling and physical simulation von Jouha, Wadia, El Oualkadi, Ahmed, Dherbécourt, Pascal, Masmoudi, Mohamed, Joubert, Eric

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PHM method for detecting degradation of GaN HEMT ON resistance, application to power converter von Boulzazen, Habib, Douzi, Chawki, Joubert, Eric, Dherbécourt, Pascal, Kadi, Moncef, Fouquet, François

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Reliability and failure analysis in power GaN-HEMTs during S-band pulsed-RF operating von Moultif, N., Duguay, S., Latry, O., Ndiaye, M., Joubert, E.

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Reliability Assessment Of AlGaN/GaN HEMTs on the SiC Substrate Under the RF Stress von Moultif, Niemat, Latry, Olivier, Joubert, Eric, Ndiaye, Mohamed, Moreau, Christian, Goupy, Jean-Francois, Carton, Patrick

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A novel methodology to characterize LGA packaged GaN power transistors using a mother/daughter board configuration for the reliability qualification in the mild hybrid applications von Douzi, Chawki, Kadi, Moncef, Dherbecourt, Pascal, Besserour, Mohamed Akram, Joubert, Eric, Fouquet, François

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Silicon Carbide Power MOSFET Model: An Accurate Parameter Extraction Method Based on the Levenberg-Marquardt Algorithm von Jouha, Wadia, El Oualkadi, Ahmed, Dherbecourt, Pascal, Joubert, Eric, Masmoudi, Mohamed

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S-band pulsed-RF operating life test on AlGaN/GaN HEMT devices for radar application von Moultif, N., Latry, O., Ndiaye, M., Neveu, T., Joubert, E., Moreau, C., Goupy, J-F.

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Characterization of HTRB stress effects on SiC MOSFETs using photon emission spectral signatures von Moultif, N., Joubert, E., Masmoudi, M., Latry, O.

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Localizing and analyzing defects in AlGaN/GaN HEMT using photon emission spectral signatures von Moultif, Niemat, Divay, Alexis, Joubert, Eric, Latry, Olivier

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Nonemergency PCI at Hospitals with or without On-Site Cardiac Surgery von Jacobs, Alice K, Normand, Sharon-Lise T, Massaro, Joseph M, Cutlip, Donald E, Carrozza, Joseph P, Marks, Anthony D, Murphy, Nancy, Romm, Iyah K, Biondolillo, Madeleine, Mauri, Laura

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An Improved SPICE Model for the Study of Electro-thermal Static Behavior for two New Generations of SiC MOSFET von Jouha, Wadia, Dherbécourt, Pascal, El Oualkadi, Ahmed, Joubert, Eric, Masmoudi, Mohamed Lamine

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Reliability Study of Mechatronic Power Components Using Spectral Photon Emission Microscopy von Moultif, N., Joubert, E., Latry, O.

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Temperature and Dilatation Estimation for Modern Semiconductor Devices von Joubert, Eric, Latry, Olivier, Roux, Jean-Philippe

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Comparison of different feedback signals used in one stage PMD compensators for different modulation formats von Ducournau, Guillaume, Latry, Olivier, Joubert, Eric, Ketata, Mohamed

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Method of filtering applications von Lu, Monique, Joubert, Eric

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Method of filtering applications von Lu, Monique, Joubert, Eric

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Secure registration to a service provided by a web server von Lu, Monique, Joubert, Eric

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Experimental considerations on bandwidth measurement of ultra-fast photoreceptors by optical heterodyning von Latry, Olivier, Ducournau, Guillaume, Dherbécourt, Pascal, Joubert, Eric, Kétata, Mohamed

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Simultaneous measures of temperature and expansion on electronic compound von Fontaine, M, Joubert, E, Latry, O, Gauthier, C, Regard, C, Polaert, H, Eudeline, P, Ketata, M

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