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  1. 1
    METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM

    METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM von SMEETS, Marit Rosa, JONKER, Caspar Theodorus Hugo, ZIELINSKI, Marcin Stefan, BOLTJE, Daan Benjamin, LAST, Mart Guus Ferdinand

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  2. 2
    METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM

    METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM von SMEETS, Marit Rosa, JONKER, Caspar Theodorus Hugo, ZIELINSKI, Marcin Stefan, BOLTJE, Daan Benjamin, LAST, Mart Guus Ferdinand

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  3. 3
    Method and apparatus for micromachining a sample using a Focused Ion Beam

    Method and apparatus for micromachining a sample using a Focused Ion Beam von MART GUUS FERDINAND LAST, DAAN BENJAMIN BOLTJE, MARIT ROSA SMEETS, CASPAR THEODORUS HUGO JONKER, MARCIN STEFAN ZIELINKSI

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  4. 4
    METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM

    METHOD AND APPARATUS FOR MICROMACHINING A SAMPLE USING A FOCUSED ION BEAM von SMEETS, Marit Rosa, JONKER, Caspar Theodorus Hugo, ZIELINSKI, Marcin Stefan, BOLTJE, Daan Benjamin, LAST, Mart Guus Ferdinand

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