Opportunities and challenges for biomarker discovery using electronic health record data von Singhal, P., Tan, A.L.M., Drivas, T.G., Johnson, K.B., Ritchie, M.D., Beaulieu-Jones, B.K.

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Nutritional Content and Production Efficiency of School Lunch Programs in Illinois Schools von Jones, B.K

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Radiation hard silicon detectors—developments by the RD48 (ROSE) collaboration von Lindström, G, Ahmed, M, Albergo, S, Anderson, D, Augelli, V, Bacchetta, N, Bartalini, P, Bates, R, Biggeri, U, Bisello, D, Boemi, D, Borchi, E, Burger, P, Campabadal, F, Chilingarov, A, Ciampolini, P, Cindro, V, Creanza, D, Da Via, C, Davies, G, De Boer, W, Dell’Orso, R, Dezillie, B, Eremin, V, Evrard, O, Fanourakis, G, Feick, H, Focardi, E, Fonseca, L, Fretwurst, E, Fuster, J, Gabathuler, K, Glaser, M, Hall, G, Heising, S, Holmes-Siedle, A, Hughes, G, Jones, B.K, Jungermann, L, Kohout, Z, Kramberger, G, Kuhnke, M, Kwan, S, Lemeilleur, F, Leroy, C, Li, Z, Ligonzo, T, Linhart, V, Litovchenko, P, Loukas, D, Lozano, M, Luczynski, Z, Lutz, G, MacEvoy, B, Manolopoulos, S, Markou, A, Martinez, C, Messineo, A, Moll, M, Oshea, V, Parrini, G, Passeri, D, Petre, D, Pickford, A, Pintilie, I, Pospisil, S, Raine, C, Ratoff, P.N, Richter, R.H, Roy, P, Ruzin, A, Ryazanov, A.I, Santocchia, A, Schiavulli, L, Sicho, P, Slysz, W, Smith, K, Stolze, K, Sundby Avset, B, Svensson, B, Tivarus, C, Tricomi, A, Tzamarias, S, Valvo, G, Vasilescu, A, Vayaki, A, Verbitskaya, E, Verdini, P, Vrba, V, Watts, S, Weber, E.R, Wegrzecki, M, Wegrzecka, I, Wheadon, R, Wilhelm, I, Wunstorf, R, Wüstenfeld, J, Wyss, J, Zankel, K, Žontar, D

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Negative capacitance effects in semiconductor diodes von Jones, B.K., Santana, J., McPherson, M.

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Low-frequency noise spectroscopy von Jones, B.K.

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Modelling of semiconductor diodes made of high defect concentration, irradiated, high resistivity and semi-insulating material : The capacitance-voltage characteristics von SAADOUNE, A, DEHIMI, L, SENGOUGA, N, MCPHERSON, M, JONES, B. K

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Modelling of semi-conductor diodes made of high defect concentration, irradiated, high resistivity and semi-insulating material: the internal field von Dehimi, L., Sengouga, N., Jones, B.K.

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Modelling of semi-conductor diodes made of high defect concentration, irradiated, high resistivity and semi-insulating material: the current–voltage characteristics von Dehimi, L., Sengouga, N., Jones, B.K.

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Developments for radiation hard silicon detectors by defect engineering—results by the CERN RD48 (ROSE) Collaboration von Lindström, G., Ahmed, M., Albergo, S., Allport, P., Anderson, D., Andricek, L., Angarano, M.M., Bacchetta, N., Bartalini, P., Biggeri, U., Bilei, G.M., Bisello, D., Boemi, D., Brodbeck, T.J., Bruzzi, M., Budzynski, T., Burger, P., Campabadal, F., Casse, G., Catacchini, E., Chilingarov, A., Ciampolini, P., Cindro, V., Costa, M.J., Creanza, D., Davies, G., De Boer, W., Dell’Orso, R., De Palma, M., Dezillie, B., Fallica, G., Fanourakis, G., Focardi, E., Fonseca, L., Fretwurst, E., Fuster, J., Gabathuler, K., Glaser, M., Grabiec, P., Huhtinen, M., Ivanov, A., Jones, B.K., Kaminsky, A., Kohout, Z., Kramberger, G., Kuhnke, M., Lemeilleur, F., Letheren, M., Ligonzo, T., Linhart, V., Litovchenko, P., Loukas, D., MacEvoy, B., Manolopoulos, S., Martinez, C., Messineo, A., Moll, M., Nossarzewska, E., Parrini, G., Passeri, D., Pickford, A., Pintilie, L., Pospisil, S., Potenza, R., Rafi, J.M., Ratoff, P.N., Richter, R.H., Riedler, P., Roy, P., Ruzin, A., Ryazanov, A.I., Santocchia, A., Schiavulli, L., Sicho, P., Sloan, T., Slysz, W., Solanky, M., Stolze, K., Sundby Avset, B., Tonelli, G., Tricomi, A., Tzamarias, S., Valvo, G., Vasilescu, A., Verbitskaya, E., Verdini, P., Vrba, V., Watts, S., Weber, E.R., Wegrzecki, M., Wegrzecka, I., Weilhammer, P., Wheadon, R., Wilburn, C., Wilhelm, I., Wunstorf, R., Wüstenfeld, J., Wyss, J., Zabierowski, P., Zontar, D.

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Instruments for-measuring surface profiles: An application in the study of ancient human tooth crown surfaces von Hillson, S.W., Jones, B.K.

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The biological fate of vinylidene chloride in rats von Jones, B.K., Hathway, D.E.

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Logarithmic distributions in reliability analysis von Jones, B.K.

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Semiconductor detectors for use in high radiation damage environments — Semi-insulating GaAs or silicon? von Jones, B.K., Santana, J., McPherson, M.

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Ohmic I–V characteristics in semi-insulating semiconductor diodes von Jones, B.K., Santana, J., McPherson, M.

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A comparison of the trap properties and locations within GaAs field effect transistors measured under different bias conditions von Azhar Iqbal, M., Jones, B.K.

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The coherence of the gate and drain noise in stressed AlGaAs–InAlGaAs PHEMTs von Jones, B.K, Graham, C.N, Konczakowska, A, Hasse, L

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Predictors of beef tenderness among carcasses produced under commercial conditions von Jones, B. K, Tatum, J. D

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Noise and DC characteristics of power silicon diodes von Crook, R., Jones, B.K.

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The excess noise in integrated circuit interconnects before and after electromigration damage von Guo, Jianping, Jones, B.K, Trefan, G

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Application of metal zoning to gold exploration in porphyry copper systems von Jones, Brian K.

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