Highly accurate thickness measurement of multi-layered automotive paints using terahertz technology von Krimi, Soufiene, Klier, Jens, Jonuscheit, Joachim, von Freymann, Georg, Urbansky, Ralph, Beigang, René

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Interferometry-aided terahertz time-domain spectroscopy von Molter, Daniel, Trierweiler, Manuel, Ellrich, Frank, Jonuscheit, Joachim, Von Freymann, Georg

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Fast FMCW Terahertz Imaging for In-Process Defect Detection in Press Sleeves for the Paper Industry and Image Evaluation with a Machine Learning Approach von Bauer, Maris, Hussung, Raphael, Matheis, Carsten, Reichert, Hermann, Weichenberger, Peter, Beck, Jens, Matuschczyk, Uwe, Jonuscheit, Joachim, Friederich, Fabian

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Influence of System Performance on Layer Thickness Determination Using Terahertz Time-Domain Spectroscopy von Weber, Stefan, Liebelt, Lukas, Klier, Jens, Pfeiffer, Tobias, Molter, Daniel, Ellrich, Frank, Jonuscheit, Joachim, Freymann, Georg Von

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Kilohertz Pixel-Rate Multilayer Terahertz Imaging of Subwavelength Coatings von Molter, Daniel, Ellenberger, Kim-Sophie, Klier, Jens, Duran, Stefan, Jonuscheit, Joachim, von Freymann, Georg, Vieweg, Nico, Deninger, Anselm

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Terahertz Radome Inspection von Friederich, Fabian, May, Karl, Baccouche, Bessem, Matheis, Carsten, Bauer, Maris, Jonuscheit, Joachim, Moor, Michael, Denman, David, Bramble, Jamie, Savage, Nick

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Mail Inspection Based on Terahertz Time-Domain Spectroscopy von Molter, Daniel, Hübsch, Daniel, Sprenger, Thorsten, Hens, Korbinian, Nalpantidis, Konstantinos, Platte, Frank, Torosyan, Garik, Beigang, René, Jonuscheit, Joachim, Freymann, Georg von, Ellrich, Frank

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Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters von Jonuscheit, Joachim, von Freymann, Georg, Beigang, René, Peytavit, Emilien, Zouaghi, Wissem, Ellrich, Frank, Molter, Daniel, Schreiner, Nina Susan, Torosyan, Garik, Klier, Jens, Lampin, Jean-Francois

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Terahertz Waves for Thickness Analyses von Jonuscheit, Joachim

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Terahertz Waves for Thickness Analyses: Non‐destructive component analysis using terahertz time domain spectroscopy von Jonuscheit, Joachim

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Three-Dimensional Terahertz Imaging With Sparse Multistatic Line Arrays von Baccouche, Bessem, Agostini, Patrick, Mohammadzadeh, Shiva, Kahl, Matthias, Weisenstein, Christian, Jonuscheit, Joachim, Keil, Andreas, Loffler, Torsten, Sauer-Greff, Wolfgang, Urbansky, Ralph, Bolivar, Peter Haring, Friederich, Fabian

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Terahertz thickness determination with interferometric vibration correction for industrial applications von Pfeiffer, Tobias, Weber, Stefan, Klier, Jens, Bachtler, Sebastian, Molter, Daniel, Jonuscheit, Joachim, Von Freymann, Georg

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Compact fiber-coupled terahertz spectroscopy system pumped at 800 nm wavelength von Ellrich, Frank, Weinland, Tristan, Molter, Daniel, Jonuscheit, Joachim, Beigang, René

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SelfPaint-A self-programming paint booth von Edelvik, Fredrik, Tiedje, Oliver, Jonuscheit, Joachim, Carlson, Johan S.

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Terahertz-Wellen — ein neuer Spektralbereich für die industrielle Messtechnik von Ellrich, Frank, Weinland, Tristan, Klier, Jens, Jonuscheit, Joachim, Beigang, René

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Applicability of compressive sensing on three-dimensional terahertz imagery for in-depth object defect detection and recognition using a dedicated semisupervised image processing m... von Brook, Anna, Cristofani, Edison, Becquaert, Mathias, Lauwens, Ben, Jonuscheit, Joachim, Vandewal, Marijke

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A pulsed THz imaging system with a line focus and a balanced 1-D detection scheme with two industrial CCD line-scan cameras von Wiegand, Christian, Herrmann, Michael, Bachtler, Sebastian, Klier, Jens, Molter, Daniel, Jonuscheit, Joachim, Beigang, René

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Terahertz-Bildgebung in industriellen Anwendungen (Terahertz Imaging in Industrial Applications) von Theuer, Michael, Torosyan, Garik, Ellrich, Frank, Jonuscheit, Joachim, Beigang, René

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In-depth high-resolution SAR imaging using Omega-k applied to FMCW systems von Cristofani, E., Vandewal, M., Matheis, C., Jonuscheit, J.

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Terahertz Techniques in NDE von Jonuscheit, Joachim

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