Political governance in China’s state-owned enterprises von Jin, Xiankun, Xu, Liping, Xin, Yu, Adhikari, Ajay

Volltext

Direct Current to Digital Converter (DIDC): A Current Sensor von Karimpour, Saeid, Sekyere, Michael, Bruce, Isaac, Darko, Emmanuel Nti, Chen, Degang, McAndrew, Colin C, Garrity, Doug, Jin, Xiankun, Hatirnaz, Ilhan, He, Chen

Volltext

Fast Gate Leakage Current Monitor With Large Dynamic Range von Bhatheja, Kushagra, Jin, Xiankun, Strong, Matthew, Chen, Degang

Volltext

Matching Critical Analog Circuit Components Up to 3rd Order Gradients for All Possible Exact Matching Ratios von Sekyere, Michael, Bruce, Isaac, Yang, Ruohan, Chen, Degang, McAndrew, Colin C., Jin, Xiankun, He, Chen, Garrity, Doug

Volltext

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test von Chen, Tao, Jin, Xiankun, Geiger, Randall L., Chen, Degang

Volltext

Testing of on-chip analog-mixed signal circuits using on-chip memory von Abhishek, Kumar, Jin, Xiankun, Lehmann, Mark

Volltext bestellen

TESTING OF ON-CHIP ANALOG-MIXED SIGNAL CIRCUITS USING ON-CHIP MEMORY von Abhishek, Kumar, Jin, Xiankun, Lehmann, Mark

Volltext bestellen

TESTING OF ON-CHIP ANALOG-MIXED SIGNAL CIRCUITS USING ON-CHIP MEMORY von Abhishek, Kumar, Jin, Xiankun, Lehmann, Mark

Volltext bestellen

RAMP VOLTAGE GENERATOR AND METHOD FOR TESTING AN ANALOG-TO-DIGITAL CONVERTER von Garrity, Douglas Alan, Jin, Xiankun

Volltext bestellen

Compensated alternating polarity capacitive structures von Jones, III, Robert S, Jin, Xiankun

Volltext bestellen

Apparatuses involving calibration of input offset voltage and signal delay of circuits and methods thereof von Chen, Tao, Jin, Xiankun, Schat, Jan-Peter

Volltext bestellen

Built-in self test for A/D converter von Jin, Xiankun, Stachew, Mark

Volltext bestellen

Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning von Arunachalam, Ayush, Kintz, Ian, Banerjee, Suvadeep, Raha, Arnab, Jin, Xiankun, Su, Fei, Prasanth, Viswanathan Pillai, Parekhji, Rubin A, Natarajan, Suriyaprakash, Basu, Kanad

Volltext bestellen

Systems and methods for detecting faults in an analog input/output circuitry von Jagannathan, Srikanth, Abhishek, Kumar, Jin, Xiankun

Volltext bestellen

SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT CIRCUITRY von Jagannathan, Srikanth, Abhishek, Kumar, Jin, Xiankun

Volltext bestellen

SYSTEMS AND METHODS FOR DETECTING FAULTS IN ANALOG INPUT/OUTPUT CIRCUITRY von Jagannathan, Srikanth, Abhishek, Kumar, Jin, Xiankun

Volltext bestellen

Bootstrapped switch von Bhatheja, Kushagra, Dao, Chris C, Jin, Xiankun

Volltext bestellen

ANALOG-TEST-BUS APPARATUSES INVOLVING CALIBRATION OF COMPARATOR CIRCUITS von CHEN, Tao, JIN, Xiankun, SCHAT, Jan-Peter

Volltext bestellen

LAYERED ARCHITECTURE FOR MANAGING HEALTH OF AN ELECTRONIC SYSTEM AND METHODS FOR LAYERED HEALTH MANAGEMENT von Blazy-Winning, Mathieu, Barrilado Gonzalez, Andres, Jin, Xiankun

Volltext bestellen

BUILT-IN SELF TEST FOR A/D CONVERTER von Jin, Xiankun, Stachew, Mark

Volltext bestellen