Field failure mechanism study of solder interconnection for crystalline silicon photovoltaic module von Jeong, Jae-Seong, Park, Nochang, Han, Changwoon

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New class separability measure for radar signals von Jeong, Seong‐Jae, Lee, Seung‐Jae, Kim, Kyung‐Tae

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ISAR Cross-Range Scaling Using Radon Transform and its Projection von Jeong, Seong-Jae, Kang, Byung-Soo, Kang, Min-Seok, Kim, Kyung-Tae

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Target identification using bistatic high-resolution range profiles von Lee, Seung-Jae, Jeong, Seong-Jae, Yang, Eunjung, Kim, Kyung-Tae

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Classification of Shell-Shaped Targets Using RCS and Fuzzy Classifier von Lee, Seung-Jae, Jeong, Seong-Jae, Kang, Byung-Soo, Kim, Hyun, Chon, Sang-Mi, Kim, Kyung-Tae

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Fabrication of 30 µm Sn Microbumps by Electroplating and Investigation of IMC Characteristics on Shear Strength von Jeon, Byung-Min, Kim, Jong-Wook, Jung, Woon-Seok, Jeong, Jae-Seong, Cho, Sung-Min, Park, Hwa-Sun

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Empirical Formula to Predict the NOx Emissions from Coal Power Plant using Lab-Scale and Real-Scale Operating Data von Kim, Gyeong-Min, Jeong, Jong-Won, Jeong, Jae-Seong, Kim, Dong-Yeop, Kim, Seung-Mo, Jeon, Chung-Hwan

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Lifetime and degradation analysis of AgPt alloy thick film/AlN heater for semiconductor wafer annealing von Jeong, Jae-Seong, An, Young-Gi

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The Initial ash deposition formation in horizontal combustion reactor for blending torrefied biomass wood pellets and coals von Lee, Dae-Gyun, Lee, Ji-Hwan, Kim, Gyeong-Min, Jeong, Jae-Seong, Kim, Seung-Mo, Jeon, Chung-Hwan

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Vision-based Automatic System for Non-contact Measurement of Morphometric Characteristics of Flatfish von Jeong, Seong-Jae, Yang, Yong-Su, Lee, Kyounghoon, Kang, Jun-Gu, Lee, Dong-Gil

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Barrier properties of Cu/TiW/ITO electrode for Si heterojunction solar cell under low temperature thermal aging von Jeong, Jae-Seong, Shin, Eun-Gu

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Field failure mechanism and reproduction due to moisture for low-voltage ZnO varistors von Jeong, Jae-Seong

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A systems toxicology approach on the mechanism of uptake and toxicity of MWCNT in Caenorhabditis elegans von Eom, Hyun-Jeong, Roca, Carlos P., Roh, Ji-Yeon, Chatterjee, Nivedita, Jeong, Jae-Seong, Shim, Ilseob, Kim, Hyun-Mi, Kim, Phil-Je, Choi, Kyunghee, Giralt, Francesc, Choi, Jinhee

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Lifetime and failure analysis of perovskite-based ceramic NTC thermistors by thermal cycling and abrasion combined stress von Jeong, Jae-Seong, Lee, Won-kyoung, Lee, Chung-kuk, Choi, Joongho

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Failure mechanism and reliability test method for USB interface circuitry on CPUs for mobile devices von Jeong, Jae-Seong

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Effect of EVA discoloration in 25-year-old single crystalline silicon photovoltaic modules operated under moderate climate von Jeong, Jae-Seong

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Effect of H/Ar treatment on ZnO:B transparent conducting oxide for flexible a-Si:H/μc-Si:H photovoltaic modules under damp heat stress von Jeong, Jae-Seong, Kim, Yong-Huyn, Park, Chang-Kyun, Kim, Heon-Do, Choi, Joongho

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The degradation mechanism of flexible a-Si:H/μc-Si:H photovoltaic modules von Jeong, Jae-Seong, Kim, Yong-Hyun, Park, Chang-Kyun, Kim, Heon-Do, Choi, Joongho

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Reliability improvement of InGaN LED backlight module by accelerated life test (ALT) and screen policy of potential leakage LED von Jeong, Jae-Seong, Jung, Jin-Kyu, Park, Sang-Deuk

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Failure analysis of video processor defined as No Fault Found (NFF): Reproduction in system level and advanced analysis technique in IC level von Jeong, Jae-Seong, Park, Sang-Deuk

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