Determination of the oxidation state of iron by X-ray fluorescence spectroscopy using chemometric approaches von Panchuk, V. V., Rabdano, N. O., Goidenko, A. A., Grebenyuk, A. V., Irkaev, S. M., Semenov, V. G.

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Features of the Quantitative Analysis in Mossbauer Spectroscopy von Semenov, V G, Panchuk, V V, Irkaev, S M

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Hyperfine magnetic fields and Curie temperature in the Heusler alloy Ni2MnSn at high pressure von Gavriliuk, A. G., Stepanov, G. N., Sidorov, V. A., Irkaev, S. M.

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Moessbauer reflectometry of ultrathin multilayer Zr(10 nm)/[ 57Fe(1.6 nm)/Cr(1.7 nm)×26]/Cr(50 nm) film using synchrotron radiation von Andreeva, M.A., Irkaev, S.M., Semenov, V.G., Prokhorov, K.A., Salashchenko, N.N., Chumakov, A.I., Rüffer, R.

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Methodological problems of quantitative analysis in Mössbauer spectroscopy von Belyaev, A. A., Volodin, V. S., Irkaev, S. M., Panchuk, V. V., Semenov, V. G.

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Resonance Counters as the Best Tool for the Investigations in Material Science von Belyaev, A A, Irkaev, S M, Panchuck, V V, Semenov, V G, Volodin, V S

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Application of resonant detectors in Mössbauer spectroscopy von Belyaev, A. A., Volodin, V. S., Irkaev, S. M., Panchuk, V. V., Semenov, V. G.

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Arrangement of arsenic atoms in the PbTe lattice von Nemov, S. A., Seregin, P. P., Irkaev, S. M., Seregin, N. P.

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Features of the Quantitative Analysis in Moessbauer Spectroscopy von Semenov, V. G., Panchuk, V. V., Irkaev, S. M.

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Fluorescence analysis of a multilayer (Zr(10 nm)/[Fe(1.6 nm)/Cr(1.7 nm)]26/Cr(50 nm)/glass) structure under grazing incidence conditions von Andreeva, M. A., Odintsova, E. E., Semenov, V. G., Irkaev, S. M., Panchuk, V. V.

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The electrical activity of isoelectronic germanium impurities in lead chalcogenides von Masterov, V. F., Nasredinov, F. S., Nemov, S. A., Seregin, P. P., Ermolaev, A. V., Irkaev, S. M.

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Possibility of observing Bose-Einstein condensation in semiconductors via Mössbauer spectroscopy using the 67Zn isotope von Nemov, S. A., Seregin, N. P., Irkaev, S. M.

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Study of zinc impurity atoms in GaP, GaAs, and GaSb 67Ga(67Zn) and 67Cu(67Zn) by emission Mössbauer spectroscopy von Seregin, N. P., Nemov, S. A., Irkaev, S. M.

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Effect of background asymmetry in conversion-electron Mössbauer spectroscopy with total external reflection von ANDREEVA, M. A, BELOZERSKII, GRISHIN, O. V, SEMENOV, V. G, IRKAEV, S. M, NIKOLAEV, V. I

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Investigation of thin oxide 57Fe films by Mössbauer total external reflection von Andreeva, M. A., Belozerskii, G. N., Irkaev, S. M., Semenov, V. G., Sokolov, A. Yu, Shumilova, N. V.

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Observation of Bose condensation in (Pb0.4Sn0.6)0.86In0.14Te semiconductor solid solutions using Mössbauer spectroscopy von Nemov, S. A., Seregin, P. P., Kozhanova, Yu. V., Volkov, V. P., Seregin, N. P., Irkaev, S. M., Shamshur, D. V.

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Mössbauer study of HhpfSn in the Heusler alloy Co2MnSn under pressure von Gavriliuk, A. G., Stepanov, G. N., Irkaev, S. M.

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Grazing Incidence Mossbauer Spectroscopy: New Method for Surface Layers Analysis. I. Instrumentation von Irkaev, S M, Andreeva, M A, Semenov, V G, Belozerskii, G N, Grishin, O V

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Grazing Incidence Mossbauer Spectroscopy: New Method for Surface Layers Analysis. II. Theory of Grazing Incidence Mossbauer Spectra von Irkaev, S M, Andreeva, M A, Semenov, V G, Belozerskii, G N, Grishin, O V

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Highly sensitive Mössbauer spectrometer for SEDM and RSMR investigations von Semenov, Valentin G., Irkaev, Sobir M., Maltsev, Yurii N.

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