Applications of spectroscopic ellipsometry to microelectronics von Irene, E.A.

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Suicide death and hospital-treated suicidal behaviour in asylum seekers in the Netherlands: a national registry-based study von Goosen, Simone, Kunst, Anton E, Stronks, Karien, van Oostrum, Irene E A, Uitenbroek, Daan G, Kerkhof, Ad J F M

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A spectroscopic immersion ellipsometry study of SiO2-Si interface roughness for electron cyclotron resonance plasma and thermally oxidized Si surfaces von Zhao, C., Lefebvre, P.R., Irene, E.A.

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Mortality and causes of death among asylum seekers in the Netherlands, 2002–2005 von van Oostrum, I E A, Goosen, S, Uitenbroek, D G, Koppenaal, H, Stronks, K

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Ellipsometry study of poly( o-methoxyaniline) thin films von Shrestha, R.P., Yang, D., Irene, E.A.

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A study of the optical and electronic properties of poly (vinylidene fluoride–trifluoroethylene) copolymer thin films von Li, Y.X., Yan, L., Shrestha, R.P., Yang, D., Ounaies, Z., Irene, E.A.

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Optical properties of N, N′-bis(3-phenoxy-3-phenoxy-phenoxy)-1,4,5,8-naphthalene-tetracarboxylic diimide by spectroscopic ellipsometry von Yang, D., Shrestha, R.P., Dingemans, T.J., Samulski, E.T., Irene, E.A.

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Magnesium oxide as a candidate high-{kappa} gate dielectric von Yan, L., Lopez, C.M., Shrestha, R.P., Irene, E.A., Suvorova, A.A., Saunders, M., Centre for Microscopy and Microanalysis, University of Western Australia, Crawley 6009, WA

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A spectroscopic immersion ellipsometry study of SiO 2-Si interface roughness for electron cyclotron resonance plasma and thermally oxidized Si surfaces von Zhao, C., Lefebvre, P.R., Irene, E.A.

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Molecular sieving by electropolymerized porphyrin films only a few monolayers thick von Pressprich, K. A, Maybury, S. G, Thomas, R. E, Linton, R. W, Irene, E. A, Murray, Royce W

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In situ ellipsometry for monitoring nucleation and growth of silicon on silicon dioxide von Basa, C, Hu, Y.Z, Irene, E.A

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A spectroscopic anisotropy ellipsometry study of YBa 2Cu 3O 7− x superconductors von Michaelis, A, Irene, E.A, Auciello, O, Krauss, A.R, Veal, B

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An electrical study of a thin film poly(o-methoxyaniline) field effect transitor von Bianchi, R.F., Onmori, R.K., Goncalves, D., de Andrade, A.M., Faria, R.M., Irene, E.A.

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An in situ and ex situ ellipsometry comparison of the interfaces of Si and GaAs resulting from thermal and plasma oxidation von Lefebvre, P.R., Zhao, C., Irene, E.A.

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A spectroscopic anisotropy ellipsometry study of YBa2Cu3O7−x superconductors von Michaelis, A, Irene, E.A, Auciello, O, Krauss, A.R, Veal, B

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A comparison of the Oxidation and Passivation of Si, Ge and InP von Irene, E.A.

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A square law for the analysis of real time ellipsometric nucleation and growth data von Hu, Y.Z., Zhao, C.Y., Gao, W.X., Irene, E.A.

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SiO2 Based MOSFETS: Film Growth and Si—SiO2 Interface Properties von Irene, E.A.

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In situ spectroscopic ellipsometric investigation of argon ion bombardment of single-crystal silicon and silicon dioxide films von Hu, Y.Z., Andrews, J.W., Li, M., Irene, E.A.

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Permeant molecular sieving with electrochemically prepared 6-nm films of poly(phenylene oxide) von McCarley, Robin L, Irene, Eugene A, Murray, Royce W

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