SPIE member guide : 1995 \ SPIE-the International Society for Optical Engineering von Society of Photo-optical Instrumentation Engineers

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Chip Based Nanoscopy: Towards Integration and High-throughput Imaging von Ahluwalia, Balpreet Singh, Coucheron, David Andre, Helle, Øystein Ivar, Øie, Cristina Ionica, Dullo, Firehun Tsige

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The Atacama large aperture submillimeter telescope (AtLAST) concept von Klaassen, Pamela D, Mroczkowski, Tony, Cicone, Claudia, Hatziminaoglou, Evanthia, Sartori, Sabrina, De Breuck, Carlos, Bryan, Sean, Dicker, Simon R, Duran, Carlos, Groppi, Chris, Kärcher, Hans, Kawabe, Ryohei, Kohno, Kotaro, Geach, James

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Strategies for the Design and Operation of Resilient Extraterrestrial Habitats von Dyke, Shirley J., Marais, Karen, Werfelc, Justin, Mallad, Ramesh

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Adaptive fluctuation imaging captures rapid subcellular dynamics von Opstad, Ida Sundvor, Ströhl, Florian, Birgisdottir, Åsa birna, Maldonado, Sebastián Andrés Acuña, Kalstad, Trine, Myrmel, Truls, Agarwal, Krishna, Ahluwalia, Balpreet Singh

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Displacement Talbot lithography: an alternative technique to fabricate nanostructured metamaterials von Le Boulbar, Emmanuel, Lis, Szymon, Chausse, Pierre, Shields, Philip

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Roughness evolution of optical materials induced by ion beam milling: Egert, Charles M. SPIE — Current Developments in Optical Design and Optical Engineering II. Bellingham, WA: International Society for Optical Engineering; 1992 Jul 20: 63–72. Vol. 1752

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DR ANIL KISHEN, BDS, MDS, PhD
International Association of Dental Research
International Society for Optical Engineering (SPIE)
Academy of Dental Materials
Asia‐Pacific Endodontic Confederation

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Introduction von Eldada, L. A., Lee, E. -H, He, Sailing

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Modelling of Thermal Wave Propagation in Damaged Composites with Internal Source von Ciampa, Francesco, Angioni, Stefano, Pinto, Fulvio, Scarselli, Gennaro, Almond, Darryl, Meo, Michele

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The International Society for Optical Engineering (SPIE) Photonics Europe 2018 von 岸, 哲生

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Non-destructive testing techniques based on nonlinear methods for assessment of debonding in single lap joints von Ciampa, Francesco, Scarselli, Gennnaro, Ginzburg, Dmitri, Meo, Michele

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Fabrication of off-axis optical segments: Jones, Robert A. SPIE — Current Developments in Optical Design and Optical Engineering II; 1992 Jul 20. Bellingham, WA: International Society for Optical Engineering; 1992: 73–82. Vol. 1752

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Active gating as a method to inhibit the crosstalk of Single Photon Avalanche Diodes in a shared well von Vilà i Arbonès, Anna Maria, Vilella Figueras, Eva, Montiel, Andreu, Alonso Casanovas, Oscar, Diéguez Barrientos, Àngel

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Investigation of geometries of bistable piezoelectric-laminate plates for vibration-based energy harvesting von Betts, David N., Bowen, Christopher R., Inman, Daniel J., Weaver, Paul M., Kim, H. A.

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Center for Optics Manufacturing - deterministic microgrinding: Golini, Donald; Czajkowski, Walter C. SPIE - Current Developments in Optical Design and Optical Engineering II; 1992 Jul 20. Bellingham, WA: International Society for Optical Engineering; 1992: 146–152. Vol. 1752

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OPTICAM SM update: Liedes, Jyrki T. SPIE - Current Developments in Optical Design and Optical Engineering II; 1992 Jul 20. Bellingham, WA: International Society for Optical Engineering; 1992: 153–157. Vol. 1752

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Process support for OPTICAM: a concurrent engineering approach: Czajkowski, W.; Tipps, J. D., Jr. SPIE — Current Developments in Optical Design and Optical Engineering II; 1992 Jul 20; San Diego, CA. International Society for Optical Engineering; 1992: 171-4

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OPTICAM PM machine design: Liedes, Jyrki T. SPIE - Current Developments in Optical Design and Optical Engineering II. 1992 Jul 20–21. Bellingham, WA: International Society for Optical Engineering; 1992; 158–163. Vol. 1752

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Problems and solving methods of on-line measuring straightness: Liang Jian-Cheng; Li Sheng-Yi; Yang Shu-Zi. Proceedings of the SPIE - The International Society for Optical Engineering Second International Symposium on Measurement Technology and Intelligent Instruments; 1929 Oct 5; Wuhan, China. Bellingham, WA: Society of Photo-Optical Instrumentation Engineers; 1993: 1081–1084

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