Compact Spreading Resistance Model for Rectangular Contacts on Uniform and Epitaxial Substrates von Kristiansson, S., Ingvarson, F., Jeppson, K.O.

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A surface potential model for predicting substrate noise coupling in integrated circuits von Kristiansson, S., Ingvarson, F., Kagganti, S.P., Simic, N., Zgrda, M., Jeppson, K.O.

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90-nm CMOS for microwave power applications von Ferndahl, M., Vickes, H.-O., Zirath, H., Angelov, I., Ingvarson, F., Litwin, A.

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Extraction of the base and emitter resistances in bipolar transistors using an accurate base resistance model von Ingvarson, F., Linder, M., Jeppson, K.O.

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Extraction of emitter and base series resistances of bipolar transistors from a single DC measurement von Linder, M., Ingvarson, F., Jeppson, K.O., Grahn, J.V., Shi-Li Zhang, Ostling, M.

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On DC modeling of the base resistance in bipolar transistors von Linder, M, Ingvarson, F, Jeppson, K.O, Grahn, J.V, Zhang, S.-L, Östling, M

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Recovery and stress dynamics in bipolar transistors and MOS devices von Ingvarson, F., Ragnarsson, L-Å., Lundgren, P.

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Extraction of the intrinsic base region sheet resistance in bipolar transistors von Ingvarson, F., Linder, M., Jeppson, K.O., Zhang, S.-L., Grahn, J.V., Ostling, M.

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A comparison of the exact and an approximate solution for the resistance between two coplanar circular discs von Kristiansson, Simon, Kagganti, Shiva P., Ingvarson, Fredrik, Jeppson, Kjell O.

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Properties and modeling of ground structures for reducing substrate noise coupling in ICs von Kristiansson, S., Ingvarson, F., Jeppson, K.O.

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A new direct extraction algorithm for intrinsic Gummel-Poon BJT model parameters von Ingvarson, F., Jeppson, K.O.

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A surface potential model for predicting substrate noise coupling in integrated circuits von Kristiansson, S., Ingvarson, F., Kagganti, S.P., Jeppson, K.O.

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An empirical table based HBT large signal model von Angelov, I., Schreurs, D., Andersson, K., Ferridahl, M., Ingvarson, F.

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Parameter extraction for bipolar transistors von Ingvarson, Fredrik, Jeppson, Kjell O.

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Stress and recovery transients in bipolar transistors and MOS structures von Ingvarson, F., Ragnarsson, L.-A., Lundgren, P., Jeppson, K.O.

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A new test structure for parasitic resistance extraction in bipolar transistors von Linder, M., Ingvarson, F., Jeppson, K.O., Shi-Li Zhang, Grahn, J.V., Ostling, M.

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A procedure for characterizing the BJT base resistance and Early voltages utilizing a dual base transistor test structure von Ingvarson, F., Linder, M., Jeppson, K.O., Shi-Li Zhang, Grahn, J.V., Ostling, M.

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A new procedure for extraction of series resistances for bipolar transistors from DC measurements von Linder, M., Ingvarson, F., Jeppson, K.O., Grahn, J.V., Zhang, S.-L., Ostling, M.

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Evaluation of active cancellation of substrate noise in mixed-signal ICs von Baghchehsaraei, Z., Kristiansson, S., Ingvarson, F., Jeppson, K.O.

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Modeling of rectangular contacts for noise coupling analysis in homogeneous substrates von Kristiansson, S., Ingvarson, F., Jeppson, K.

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