Metamorphic InAlAs/InGaAs/InAlAs/GaAs HEMT heterostructures containing strained superlattices and inverse steps in the metamorphic buffer von Galiev, G.B., Vasil'evskii, I.S., Pushkarev, S.S., Klimov, Е.А., Imamov, R.M., Buffat, P.A., Dwir, B., Suvorova, Е.I.

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Study of new designs for the InAlAs metamorphic buffer on GaAs substrates with distributed compensation of elastic deformations von Galiev, G. B., Pushkarev, S. S., Vasil’evskii, I. S., Klimov, E. A., Imamov, R. M.

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Study of the influence of strained superlattices introduced into a metamorphic buffer on the electrophysical properties and the atomic structure of InAIAs/InGaAs MHEMT heterostruct... von Galiev, G.B, Pushkarev, S.S, Vasil'evskii, I.S, Zhigalina, O.M, Klimov, E.A, Zhigalina, V.G, Imamov, R.M

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Production of γ-TiAl Sheets with Improved Superplastic Properties by Pack Rolling von Kuznetsov, A.V., Shagiev, M.R., Imamov, R.M., Imayev, V.M., Salishchev, Gennady A.

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Asymmetric monochromator in noncoplanar diffraction geometry von Pashaev, E.M., Vavilov, A.V., Imamov, R.M., Afanas'ev, A.M., Djomkina, T.B.

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Application of the Renninger effect to X-ray double-plane collimation von Stepanov, S.A., Kondrashkina, E.A., Novikov, D.V., Imamov, R.M.

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Investigation of the structure of real indium antimonide surfaces by the asymptotic Bragg diffraction method von Afanas'ev, A.M., Imamov, R.M., Lomov, A.A., Margushev, Z.Ch, Maslov, A.V.

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Grazing Incidence Diffraction X-Ray Topography von Novikov, D.V., Imamov, R.M.

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Structure and properties of TiSi2 films on Si, obtained by Ti and Si co-evaporation in high vacuum von Valiev, K.A., Vasiliev, A.G., Orlikovskij, A.A., Vasiliev, A.L., Golovin, A.L., Imamov, R.M., Kiselev, N.A.

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Structure and properties of TiSi 2 films on Si, obtained by Ti and Si co-evaporation in high vacuum von Valiev, K.A., Vasiliev, A.G., Orlikovskij, A.A., Vasiliev, A.L., Golovin, A.L., Imamov, R.M., Kiselev, N.A.

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A new method of measuring electron emission from monocrystals under x-ray-diffraction conditions von Hertel, N., Kovalchuk, M.V., Afanasev, A.M., Imamov, R.M.

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PROCESS OF TIMELY TEST OF ROUGHNESS OF SUPERSMOOTH LARGE- SIZED SURFACES BY METHOD OF X-RAY SCANNING AND DEVICE FOR ITS IMPLEMENTATION von SHISHKOV V.A, VALIEV K.A, IMAMOV R.M, PROTOPOPOV V.V

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Electron diffraction structure analysis of crystal and amorphous substances von Pinsker, Z.G., Imamov, R.M., Man, L.I.

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Grazing Bragg-Laue diffraction for studying the crystal structure of thin films von Afanasiev, A. M., Afanasiev, S. M., Aleksandrov, P. A., Imamov, R. M., Pashaev, E. M.

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Crystal structure of thin films of some rare earth oxides (Sm, Eu, Gd, Er, Yb) von Semiletov, S.A., Imamov, R.M., Ragimli, N.A., Man, L.I.

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Photoelectron yield in x-ray grazing-incidence diffraction von Imamov, R.M., Mukhamedzhanov, E.Kh, Maslov, A.V., Pashaev, E.M., Afanas'ev, A.M.

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Photoeffect in X-ray grazing incidence diffraction von Afanasev, A. M., Imamov, R. M., Maslov, A. V., Pashaev, E. M.

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