High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses von Huang, Xiaojing, Ozturk, Hande, Yan, Hanfei, He, Yan, Ge, Mingyuan, Dong, Zhihua, Lin, Meifeng, Nazaretski, Evgeny, Ilinski, Petr, Robinson, Ian, Chu, Yong

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Optimization of NSLS-II Blade X-ray Beam Position Monitors: from Photoemission type to Diamond Detector von Ilinski, Petr

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NSLS-II X-ray diagnostics development von Ilinski, Petr

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The direct mapping of the uptake of platinum anticancer agents in individual human ovarian adenocarcinoma cells using a hard X-ray microprobe von ILINSKI, Petr, LAI, Barry, PHILLIPS, Don R, STAMPFL, Anton P. J, ZHONGHOU CAI, WENBING YUN, LEGNINI, Daniel, TALARICO, Teresa, CHOLEWA, Marian, WEBSTER, Lorraine K, DEACON, Glen B, RAINONE, Silvina

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Composition characterization of combinatorial materials by scanning X-ray fluorescence microscopy using microfocused synchrotron X-ray beam von Vogt, Stefan, Chu, Yong S., Tkachuk, Andrei, Ilinski, Petr, Walko, Donald A., Tsui, Frank

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Structural investigation of CoMnGe combinatorial epitaxial thin films using microfocused synchrotron X-ray von Chu, Yong S., Tkachuk, Andrei, Vogt, Stefan, Ilinski, Petr, Walko, Donald A., Mancini, Derrick C., Dufresne, Eric M., He, Liang, Tsui, Frank

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NSLS-II X-ray diagnostics development von Ilinski, Petr

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Method for the determination of the three-dimensional structure of ultrashort relativistic electron bunches von Geloni, Gianluca, Ilinski, Petr, Saldin, Evgeni, Schneidmiller, Evgeni, Yurkov, Mikhail

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Method for the determination of the three-dimensional structure of ultrashort relativistic electron bunches von Geloni, Gianluca, Ilinski, Petr, Saldin, Evgeni, Schneidmiller, Evgeni, Yurkov, Mikhail

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