Optical Modeling-Assisted Characterization of Polymer:Fullerene Photodiodes von Jo, Jun Hyung, Chun, Yong-Sik, Kim, Ilgu

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COSMETIC COMPOSITION FOR IMPROVING FRAGRANCE PERSISTENCE von HAN, Nakyung, HAN, Seungmin, KIM, Ilgu, PARK, Sun Gyoo

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Limbs of life: Literature of postmodern anthropomorphic technology and cosmology von Kim, Ilgu

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ORGANIC LIGHT EMITTING DEVICES AND FABRICATION METHOD THEREOF von LEE SEUNG HYUN, KIM ILGU

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Cosmetics composition containing powder von CHOI SEUNG MAN, ILGU KIM, KIM SUNYOUNG

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A cosmetic composition which improves flavor persistence von HAN SEUNGMIN, PARK SUN GYOO, ILGU KIM, HAN NAKYUNG

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COSMETIC COMPOSITION FOR IMPROVING FRAGRANCE PERSISTENCE von HAN, Nakyung, HAN, Seungmin, KIM, Ilgu, PARK, Sun Gyoo

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3D Manufacturing method of strain gauge using 3D printing von KWANG JUN CHOI, PARK YOUNG MIN, YANG HO CHANG, YOUNG KYU HONG, KIM ILGU

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Method of manufacturing smart blind von SEO YU SEOK, PARK YOUNG MIN, YANG HO CHANG, JANG SEONG HOON, LEE SEUNG HYUN, BUMJOO LEE, KIM ILGU

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Smart window manufacture method of smart window and manufacture device of smart window von SEO YU SEOK, PARK YOUNG MIN, YANG HO CHANG, JANG SEONG HOON, BUMJOO LEE, LEE SEUNG HYUN, KIM ILGU

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Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens von Kim, In Joong, Yun, Ilgu

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Fabrication of rough Al doped ZnO films deposited by low pressure chemical vapor deposition for high efficiency thin film solar cells von Kim, Doyoung, Yun, Ilgu, Kim, Hyungjun

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A Monolithically Integrated GaN-Based Light Emitting Transistor with a High On/Off Ratio and Low Gate Leakage Current von Kim, Jae Hun, Yun, Ilgu

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Effect of carrier concentration on optical bandgap shift in ZnO:Ga thin films von Kim, Chang Eun, Moon, Pyung, Kim, Sungyeon, Myoung, Jae-Min, Jang, Hyeon Woo, Bang, Jungsik, Yun, Ilgu

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Methodology for Plasma Diagnosis and Accurate Virtual Measurement Modeling using Optical Emission Spectroscopy von Kim, Dongyoun, Na, Seunggyu, Kim, Hyungjun, Yun, Ilgu

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Real-time plasma monitoring technique using incident-angle-dependent optical emission spectroscopy for computer-integrated manufacturing von Kim, In Joong, Yun, Ilgu

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Device characteristics of Ti–InSnO thin film transistors with modulated double and triple channel structures von Kim, Chang Eun, Yun, Ilgu

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Real-Time Plasma Uniformity Measurement Technique Using Optical Emission Spectroscopy With Revolving Module von Kim, In Joong, Yun, Ilgu

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Real-Time Plasma Uniformity Monitoring via Selective Plasma Light Intensity Measurement Using Transparent-LCD-Module-Adapted Optical Emission Spectroscopy von Kim, In Joong, Park, Chuntaek, Shin, Dongseok, Yun, Ilgu

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Effects of nitrogen doping on device characteristics of InSnO thin film transistor von Eun Kim, Chang, Yun, Ilgu

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