RIFTA: A Robust Iterative Fourier Transform-based dwell time Algorithm for ultra-precision ion beam figuring of synchrotron mirrors von Wang, Tianyi, Huang, Lei, Kang, Hyukmo, Choi, Heejoo, Kim, Dae Wook, Tayabaly, Kashmira, Idir, Mourad

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Effect of electronic transitions on near edge optical properties of off-stoichiometric boron carbide thin films von Modi, Mohammed H., Gupta, Rajkumar, Yadav, Praveen K., Gupta, Shruti, Mukherjee, C., Idir, Mourad

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Special Issue "EUV and X-ray Wavefront Sensing" von Idir, Mourad, Cocco, Daniele, Huang, Lei

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Advances in X-ray optics: From metrology characterization to wavefront sensing-based optimization of active optics von Cocco, Daniele, Idir, Mourad, Morton, Daniel, Raimondi, Lorenzo, Zangrando, Marco

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One-dimensional stitching interferometry assisted by a triple-beam interferometer von Xue, Junpeng, Huang, Lei, Gao, Bo, Kaznatcheev, Konstantine, Idir, Mourad

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Genuine‐field modeling of partially coherent X‐ray imaging systems von Verhoeven, Antonie, Hellmann, Christian, Wyrowski, Frank, Idir, Mourad, Turunen, Jari

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Stitching interferometry for synchrotron mirror metrology at National Synchrotron Light Source II (NSLS-II) von Huang, Lei, Wang, Tianyi, Tayabaly, Kashmira, Kuhne, Dennis, Xu, Weihe, Xu, Wei, Vescovi, Matthew, Idir, Mourad

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Comparison of two-dimensional integration methods for shape reconstruction from gradient data von Huang, Lei, Idir, Mourad, Zuo, Chao, Kaznatcheev, Konstantine, Zhou, Lin, Asundi, Anand

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Two-dimensional stitching interferometry for self-calibration of high-order additive systematic errors von Huang, Lei, Wang, Tianyi, Nicolas, Josep, Vivo, Amparo, Polack, François, Thomasset, Muriel, Zuo, Chao, Tayabaly, Kashmira, Wook Kim, Dae, Idir, Mourad

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Two-dimensional stitching interferometry based on tilt measurement von Huang, Lei, Idir, Mourad, Zuo, Chao, Wang, Tianyi, Tayabaly, Kashmira, Lippmann, Erich

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Hybrid height and slope figuring method for grazing‐incidence reflective optics von Wang, Tianyi, Huang, Lei, Ke, Xiaolong, Zhu, Yi, Choi, Heejoo, Pullen, Weslin, Negi, Vipender, Kim, Daewook, Idir, Mourad

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EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging von de La Rochefoucauld, Ombeline, Dovillaire, Guillaume, Harms, Fabrice, Idir, Mourad, Huang, Lei, Levecq, Xavier, Piponnier, Martin, Zeitoun, Philippe

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A 2 D high accuracy slope measuring system based on a Stitching Shack Hartmann Optical Head von Idir, Mourad, Kaznatcheev, Konstantine, Dovillaire, Guillaume, Legrand, Jerome, Rungsawang, Rakchanok

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A one-dimensional ion beam figuring system for x-ray mirror fabrication von Idir, Mourad, Huang, Lei, Bouet, Nathalie, Kaznatcheev, Konstantine, Vescovi, Matthew, Lauer, Ken, Conley, Ray, Rennie, Kent, Kahn, Jim, Nethery, Richard, Zhou, Lin

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FMX – the Frontier Microfocusing Macromolecular Crystallography Beamline at the National Synchrotron Light Source II von Schneider, Dieter K., Shi, Wuxian, Andi, Babak, Jakoncic, Jean, Gao, Yuan, Bhogadi, Dileep K., Myers, Stuart F., Martins, Bruno, Skinner, John M., Aishima, Jun, Qian, Kun, Bernstein, Herbert J., Lazo, Edwin O., Langdon, Thomas, Lara, John, Shea-McCarthy, Grace, Idir, Mourad, Huang, Lei, Chubar, Oleg, Sweet, Robert M., Berman, Lonny E., McSweeney, Sean, Fuchs, Martin R.

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Approaching sub-50 nanoradian measurements by reducing the saw-tooth deviation of the autocollimator in the Nano-Optic-Measuring Machine von Qian, Shinan, Geckeler, Ralf D., Just, Andreas, Idir, Mourad, Wu, Xuehui

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Study of interface reaction in a B4C/Cr mirror at elevated temperature using soft X‐ray reflectivity von Modi, Mohammed H., Gupta, Shruti, Yadav, Praveen K., Gupta, Rajkumar, Bose, Aniruddha, Mukherjee, Chandrachur, Jonnard, Philippe, Idir, Mourad

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Nano-accuracy measurements and the surface profiler by use of Monolithic Hollow Penta-Prism for precision mirror testing von Qian, Shinan, Wayne, Lewis, Idir, Mourad

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Study of the Au‐Cr bilayer system using X‐ray reflectivity, GDOES, and ToF‐SIMS von Jonnard, Philippe, Modi, Mohammed H., Le Guen, Karine, Aneshwari, Nargish, Sinha, Mangalika, Idir, Mourad, Chapon, Patrick, Galtayries, Anouk

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Measurement Uncertainty of Highly Asymmetrically Curved Elliptical Mirrors Using Multi-Pitch Slope Stitching Technique von Huang, Lei, Wang, Tianyi, Polack, François, Nicolas, Josep, Nakhoda, Kashmira, Idir, Mourad

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